BS CECC 20000:1983
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Harmonized system of quality assessment for electronic components: generic specification: semiconductor optoelectronic and liquid crystal devices
Available format(s)
Hardcopy , PDF
Superseded date
15-09-1996
Superseded by
Language(s)
English
Published date
30-06-1983
Publisher
Prescribes quality assessment procedures and test and measurement conditions applicable to semiconductor optoelectronic and liquid crystal devices.
| Committee |
EPL/47
|
| DevelopmentNote |
Inactive for the new design. Superseded by BS EN 120000 but remains current. (08/2005)
|
| DocumentType |
Standard
|
| Pages |
100
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| CECC 20000 : 82 AMD 3 | Identical |
| BS 5555:1993 | Specification for SI units and recommendations for the use of their multiples and of certain other units |
| IEC 60134:1961 | Rating systems for electronic tubes and valves and analogous semiconductor devices |
| BS 9300:1969 | Specification for semiconductor devices of assessed quality: generic data and methods of test |
| BS 2011-2.1B:1977 | Environmental testing. Tests Tests B. Dry Heat |
| BS 9000-2(1996) : 1996 | GENERAL REQUIREMENTS FOR A SYSTEM FOR ELECTRONIC COMPONENTS OF ASSESSED QUALITY - SPECIFICATION FOR THE NATIONAL IMPLEMENTATION OF THE CECC SYSTEM |
| BS 1991(1967) : LATEST | |
| BS E9007:1975 | Specification for harmonized system of quality assessment for electronic components: Basic specification: Sampling plans and procedures for inspection by attributes |
| IEC 60306-4:1971 | Measurement of photosensitive devices. Part 4: Methods of measurement for photo-multipliers |
| BS 4727-4:GRP01(1971) : 1971 | GLOSSARY OF ELECTROTECHNICAL POWER TELECOMMUNICATION ELECTRONICS LIGHTING & COLOUR TERMS - TERMS PARTICULAR TO LIGHTING & COLOUR - RADIATION AND PHOTOMETRY |
| BS 2011-2.1Da:1977 | Environmental testing. Tests Test Da. Accelerated damp heat |
| BS 2011-2.1Z/AD:1977 | Environmental testing. Tests Tests Z/AD. Composite temperature/humidity cyclic test |
| BS 2011-2.1N:1985 | Environmental testing. Tests Test N. Change of temperature |
| BS 2045:1965 | Preferred numbers |
| BS 2011-2.1Ca:1977 | Environmental testing. Tests Test Ca. Damp heat, steady state |
| IEC 60306-1:1969 | Measurement of photosensitive devices - Part 1: Basic recommendations |
| IEC 60306-2:1969 | Measurement of photosensitive devices. Part 2: Methods of measurement of phototubes |
| ISO 2015:1976 | Numbering of weeks |
| IEC 60306-3:1970 | Measurement of photosensitive devices. Part 3: Methods of measurement of photoconductive cells for use in the visible spectrum |
| BS 3934:1965 | Specification for dimensions of semiconductor devices and integrated electronic circuits |
| BS 6001(1972) : AMD 5054 | SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS INDEXED BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT - BY - LOT INSPECTION |
| BS 2011-2.1T:1981 | Environmental testing. Tests Test T. Soldering |
Important note : All end users must be registered with an Account prior to user licenses being assigned.Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.
Are you sure?
Logging out.