BS CECC 20000:1983
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Harmonized system of quality assessment for electronic components: generic specification: semiconductor optoelectronic and liquid crystal devices
Available format(s)
Hardcopy , PDF
Superseded date
09-15-1996
Superseded by
Language(s)
English
Published date
06-30-1983
Publisher
Important note : All end users must be registered with an Account prior to user licenses being assigned.Prescribes quality assessment procedures and test and measurement conditions applicable to semiconductor optoelectronic and liquid crystal devices.
| Committee |
EPL/47
|
| DevelopmentNote |
Inactive for the new design. Superseded by BS EN 120000 but remains current. (08/2005)
|
| DocumentType |
Standard
|
| Pages |
100
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| CECC 20000 : 82 AMD 3 | Identical |
| BS 5555:1993 | Specification for SI units and recommendations for the use of their multiples and of certain other units |
| IEC 60134:1961 | Rating systems for electronic tubes and valves and analogous semiconductor devices |
| BS 9300:1969 | Specification for semiconductor devices of assessed quality: generic data and methods of test |
| BS 2011-2.1B:1977 | Environmental testing. Tests Tests B. Dry Heat |
| BS 9000-2(1996) : 1996 | GENERAL REQUIREMENTS FOR A SYSTEM FOR ELECTRONIC COMPONENTS OF ASSESSED QUALITY - SPECIFICATION FOR THE NATIONAL IMPLEMENTATION OF THE CECC SYSTEM |
| BS 1991(1967) : LATEST | |
| BS E9007:1975 | Specification for harmonized system of quality assessment for electronic components: Basic specification: Sampling plans and procedures for inspection by attributes |
| IEC 60306-4:1971 | Measurement of photosensitive devices. Part 4: Methods of measurement for photo-multipliers |
| BS 4727-4:GRP01(1971) : 1971 | GLOSSARY OF ELECTROTECHNICAL POWER TELECOMMUNICATION ELECTRONICS LIGHTING & COLOUR TERMS - TERMS PARTICULAR TO LIGHTING & COLOUR - RADIATION AND PHOTOMETRY |
| BS 2011-2.1Da:1977 | Environmental testing. Tests Test Da. Accelerated damp heat |
| BS 2011-2.1Z/AD:1977 | Environmental testing. Tests Tests Z/AD. Composite temperature/humidity cyclic test |
| BS 2011-2.1N:1985 | Environmental testing. Tests Test N. Change of temperature |
| BS 2045:1965 | Preferred numbers |
| BS 2011-2.1Ca:1977 | Environmental testing. Tests Test Ca. Damp heat, steady state |
| IEC 60306-1:1969 | Measurement of photosensitive devices - Part 1: Basic recommendations |
| IEC 60306-2:1969 | Measurement of photosensitive devices. Part 2: Methods of measurement of phototubes |
| ISO 2015:1976 | Numbering of weeks |
| IEC 60306-3:1970 | Measurement of photosensitive devices. Part 3: Methods of measurement of photoconductive cells for use in the visible spectrum |
| BS 3934:1965 | Specification for dimensions of semiconductor devices and integrated electronic circuits |
| BS 6001(1972) : AMD 5054 | SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS INDEXED BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT - BY - LOT INSPECTION |
| BS 2011-2.1T:1981 | Environmental testing. Tests Test T. Soldering |
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