VITA 51.2 : 2016
Current
Current
The latest, up-to-date edition.
PHYSICS OF FAILURE RELIABILITY PREDICTIONS
Published date
01-12-2013
Publisher
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Gives standard processes, instructions and default parameters for using the Physics of Failure (PoF) approach for modeling the reliability of electronic products.
| DocumentType |
Standard
|
| PublisherName |
Vmebus Int. Trade Association
|
| Status |
Current
|
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| SAE ARP 6338 : 2015 | PROCESS FOR ASSESSMENT AND MITIGATION OF EARLY WEAROUT OF LIFE-LIMITED MICROCIRCUITS |
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