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NEN ISO 16700 : 2016

Current

Current

The latest, up-to-date edition.

MICROBEAM ANALYSIS - SCANNING ELECTRON MICROSCOPY - GUIDELINES FOR CALIBRATING IMAGE MAGNIFICATION

Published date

01-12-2013

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Defines a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material.

DocumentType
Standard
PublisherName
Netherlands Standards
Status
Current

Standards Relationship
ISO 16700:2016 Identical

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