NEN EN IEC 62878-1-1 : 2015
Current
Current
The latest, up-to-date edition.
DEVICE EMBEDDED SUBSTRATE - PART 1-1: GENERIC SPECIFICATION - TEST METHODS
Published date
08-18-2015
Publisher
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Defines the test methods of passive and active device embedded substrates.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| EN 62878-1-1:2015 | Identical |
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