NBN EN 60749-4 : 2003
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 4: DAMP HEAT, STEADY STATE, HIGHLY ACCELERATED STRESS TEST (HAST)
01-12-2013
Foreword
1 Scope
2 HAST test - General remarks
3 Test apparatus
4 Test conditions
5 Procedure
6 Failure criteria
7 Safety
8 Summary
Bibliography
Gives a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.
| DocumentType |
Standard
|
| PublisherName |
Belgian Standards
|
| Status |
Current
|
| Standards | Relationship |
| DIN EN 60749-4:2016-06 (Draft) | Identical |
| UNE-EN 60749-4:2003 | Identical |
| BS EN 60749-4:2017 | Identical |
| EN 60749-4:2017 | Identical |
| NF EN 60749-4 : 2002 | Identical |
| I.S. EN 60749-4:2017 | Identical |
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