MIL-STD-883-1 Base Document:2019
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Environmental Test Methods for Microcircuits Part 1: Test Methods 1000-1999
Amended by
Available format(s)
PDF
Language(s)
English
Published date
09-16-2019
Publisher
Superseded date
03-06-2025
Superseded by
US$20.00
Excluding Tax where applicable
Part 1 of this test method standard establishes uniform test methods for the basic environmental testing of microelectronic devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations.
| DevelopmentNote |
New child NOT 1 2024 is added
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| DocumentType |
Standard
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| Pages |
217
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| ProductNote |
THIS STANDARD IS ALSO REFER TO: SAE MAS STD-595/15012, SAE AMS STD -595/25102, IPC J STD 004, IPC J STD 005, IPC J STD 006, IPC J STD 033, JEDEC STANDARD 12, JEDEC STANDARD 12-1, JEDEC STANDARD 12-2, JEDEC STANDARD 12-3,
New child NOT 1 2024 is added |
| PublisherName |
US Military Specs/Standards/Handbooks
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| Status |
Superseded
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| SupersededBy |
| DSCC 94028F:2021 | FILTER, EMI and TRANSIENT SUPPRESSION, HYBRID |
| DSCC 90723G:2023 | MICROCIRCUIT, HYBRID, LINEAR, HIGH POWER, OPERATIONAL AMPLIFIER |
| DSCC 87607D:2023 | MICROCIRCUIT, LINEAR, VOLTAGE-TOFREQUENCY CONVERTER, MONOLITHIC SILICON |
| ASTM D 2109 : 2001 | Standard Test Methods for Nonvolatile Matter in Halogenated Organic Solvents and Their Admixtures |
| MIL-HDBK-505 Base Document:1998 | Definitions of Item Levels, Item Exchangeability, Models, and Related Terms |
| ASTM C 177 : 2019 | Standard Test Method for Steady-State Heat Flux Measurements and Thermal Transmission Properties by Means of the Guarded-Hot-Plate Apparatus |
| ASTM E 831 : 2019 | Standard Test Method for Linear Thermal Expansion of Solid Materials by Thermomechanical Analysis |
| ASTM E 722 : 2019 | Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics |
| MIL-HDBK-1331 Revision A:2003 | Parameters to be Controlled for the Specification of Microcircuits, Handbook for |
| ISO 14644-2:2015 | Cleanrooms and associated controlled environments — Part 2: Monitoring to provide evidence of cleanroom performance related to air cleanliness by particle concentration |
| ASTM E 264 : 2019 | Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Nickel |
| ASTM E 801 : 2016 | Standard Practice for Controlling Quality of Radiographic Examination of Electronic Devices |
| ASTM D 257 : 2014 | Standard Test Methods for DC Resistance or Conductance of Insulating Materials |
| ASTM D 1002 : 2010 | Standard Test Method for Apparent Shear Strength of Single-Lap-Joint Adhesively Bonded Metal Specimens by Tension Loading (Metal-to-Metal) |
| MIL-PRF-19500 Revision P:2010 | Semiconductor Devices, General Specification for |
| ASTM F 1192 : 2011 | Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices |
| ASTM F 458 : 2013 | Standard Practice for Nondestructive Pull Testing of Wire Bonds1,2 |
| ASTM D 3850 : 2019 | Standard Test Method for Rapid Thermal Degradation of Solid Electrical Insulating Materials By Thermogravimetric Method (TGA) |
| MIL-STD-1686 Revision C:1995 | Electrostatic Discharge Control Program for Protection of Electrical and Electronic Parts, Assemblies and Equipment (Excluding Electrically Initiated Explosive Devices) (S/S by ANSI/ESD S20.20) |
| MIL-HDBK-781 Revision A:1996 | Reliability Test Methods, Plans, and Environments for Engineering Development, Qualification, and Production |
| MIL-STD-750 Revision F:2011 | Test Methods for Semiconductor Devices |
| ISO/ASTM 51275:2013 | Practice for use of a radiochromic film dosimetry system |
| ASTM D 1331 : 2014 | Standard Test Methods for Surface and Interfacial Tension of Solutions of Paints, Solvents, Solutions of Surface-Active Agents, and Related Materials |
| MIL-STD-1916 Base Document:1996 | DOD Preferred Methods for Acceptance of Product |
| MIL-PRF-680 Revision C:2010 | Degreasing Solvent |
| A-A-58092 Base Document:1997 | Tape, Antiseize, Polytetrafluorethylene |
| ASTM E 721 : 2016 | Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics |
| ASTM D 3574 : 2017 | Standard Test Methods for Flexible Cellular Materials—Slab, Bonded, and Molded Urethane Foams |
| ASTM E 1249 : 2015 | Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources |
| ASTM F 1892 : 2012 | Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices |
| MIL-PRF-38534 Revision K:2017 | Hybrid Microcircuits, General Specification for |
| ASTM E 668 : 2013 | Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices |
| MIL-HDBK-217 Revision F:1991 | Reliability Prediction of Electronic Equipment |
| SAE AMSSTD595A | Colors Used in Government Procurement |
| ASTM C 518 : 2017 | Standard Test Method for Steady-State Thermal Transmission Properties by Means of the Heat Flow Meter Apparatus |
| ASTM E 263 : 2018 | Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Iron |
| ASTM E 2450 : 2016 | Standard Practice for Application of CaF<inf>2</inf>(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments |
| ASTM E 720 : 2016 | Standard Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics |
| ISO 14644-1:2015 | Cleanrooms and associated controlled environments — Part 1: Classification of air cleanliness by particle concentration |
| ASTM D 150 : 2011 | Standard Test Methods for AC Loss Characteristics and Permittivity (Dielectric Constant) of Solid Electrical Insulation |
| MIL-PRF-38535 Revision K:2013 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
| MIL-STD-202 Revision H:2015 | Electronic and Electrical Component Parts |
| ASTM D 971 : 2012 | Standard Test Method for Interfacial Tension of Oil Against Water by the Ring Method |
| ASTM F 459 : 2013 | Standard Test Methods for Measuring Pull Strength of Microelectronic Wire Bonds |
| ASTM F 526 : 2016 | Standard Test Method for Using Calorimeters for Total Dose Measurements in Pulsed Linear Accelerator or Flash X-ray Machines |
| ASTM D 1120 : 2016 | Standard Test Method for Boiling Point of Engine Coolants |
| ASTM E 265 : 2007 | Standard Test Method for Measuring Reaction Rates and Fast-Neutron Fluences by Radioactivation of Sulfur-32 |
| ASTM E 1250 : 2015 | Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices |
| MIL-STD-1835 Revision D:2004 | Electronic Component Case Outlines |
| ASTM E 666 : 2014 | Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation |
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