MIL-PRF-19978 Revision L:2016
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Capacitor, Fixed, Plastic (or Paper-Plastic) Dielectric (Hermetically Sealed in Metal, Ceramic or Glass Cases), Established and Non-Established Reliability, General Specification for
05-14-2021
07-20-2016
1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
APPENDIX A - PROCEDURE FOR QUALIFICATION INSPECTION
Specifies the general requirements for established reliability (ER) and non-established reliability (non-ER), direct current (dc), plastic or paper-plastic dielectric, fixed capacitors, hermetically sealed in metal or ceramic or glass cases.
DevelopmentNote |
Supersedes MIL C 19978 (10/2002)
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DocumentType |
Standard
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Pages |
84
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PublisherName |
US Military Specs/Standards/Handbooks
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Status |
Superseded
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SupersededBy | |
Supersedes |
This specification covers the general requirements for established reliability (ER) and non-established reliability (non-ER), direct current (dc), plastic or paper-plastic dielectric, fixed capacitors, hermetically sealed in metal or ceramic or glass cases. Capacitors meeting the established reliability requirements specified herein have failure rate levels (FRL) ranging from 1.0 percent to 0.001 percent per 1,000 hours (see 1.2.1.9). These FRLs are established at a 90-percent confidence level and maintained at a 10-percent producer\'s risk and are based on life tests performed at maximum rated voltage and maximum rated temperature. An acceleration factor of 5:1 has been used to relate the life test data obtained at 140 percent of rated dc voltage at the applicable high test temperature to the rated voltage at the applicable high test temperature. This specification also covers removable mounting retainers for use with applicable capacitors (see 3.1). A parts per million (ppm) quality system is used for documenting and reporting the average outgoing quality of ER capacitors supplied to this specification. Statistical process control (SPC) techniques are required in the manufacturing process to minimize variation in production of ER capacitors supplied to the requirements of this specification.
MIL-STD-1580 Revision B:2003 | DESTRUCTIVE PHYSICAL ANALYSIS FOR ELECTRONIC, ELECTROMAGNETIC, AND ELECTROMECHANICAL PARTS |
MIL-PRF-19978-1 Revision F:2009 | CAPACITORS, FIXED, PLASTIC (OR PAPER-PLASTIC) DIELECTRIC, (HERMETICALLY SEALED IN METAL CASES), STYLES CQ08, CQ09, CQ12, AND CQ13 |
MIL-PRF-19978-14 Revision B:2016 | CAPACITOR, FIXED, PLASTIC DIELECTRIC, AXIAL-WIRE TERMINAL, TANGENTIAL RETAINER, TUBULAR (UNINSULATED) (HERMETICALLY SEALED IN METAL CASES), ESTABLISHED RELIABILITY, STYLE CQR32 |
MIL-PRF-19978-2 Revision E:2009 | CAPACITORS, FIXED, PLASTIC (OR PAPER-PLASTIC) DIELECTRIC, (HERMETICALLY SEALED IN CERAMIC OR GLASS CASES), STYLE CQ20 |
MIL-PRF-19978-11 Revision D:2016 | CAPACITOR, FIXED, PLASTIC (OR PAPER-PLASTIC) DIELECTRIC, AXIAL-WIRE THREADED-STUD RETAINER, TUBULAR (UNINSULATED) (HERMETICALLY SEALED IN METAL CASES), ESTABLISHED RELIABILITY, STYLE CQR13 |
MIL-PRF-19978-15 Revision B:2016 | CAPACITORS, FIXED, PLASTIC DIELECTRIC, AXIAL-WIRE TERMINAL, THREADED-STUD RETAINER, TUBULAR (UNINSULATED) (HERMETICALLY SEALED IN METAL CASES), ESTABLISHED RELIABILITY, STYLE CQR33 |
NASA MSFC STD 3012 : 2012 | ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL (EEE) PARTS MANAGEMENT AND CONTROL REQUIREMENTS FOR MSFC SPACE FLIGHT HARDWARE |
MIL-PRF-19978-9 Revision D:2016 | CAPACITOR, FIXED, PLASTIC (OR PAPER-PLASTIC) DIELECTRIC, AXIAL-WIRE TERMINAL, TUBULAR (INSULATED) (HERMETICALLY SEALED IN METAL CASES), ESTABLISHED RELIABILITY, STYLE CQR09 |
MIL-PRF-19978-3 Revision J:2016 | CAPACITOR, FIXED, PLASTIC (OR PAPER-PLASTIC) DIELECTRIC, (HERMETICALLY SEALED IN METAL CASES), STYLE CQ72 |
MIL-PRF-19978-13 Revision C:2012 | Capacitor, Fixed, Plastic Dielectric, Axial-Wire Terminal, Tubular (Insulated) (Hermetically Sealed in Metal Cases), Established Reliability, Style CQR29 |
MIL-PRF-19978-22 Revision B:2009 | CAPACITORS, FIXED, PLASTIC DIELECTRIC, AXIAL-WIRE TERMINAL, TUBULAR (INSULATED) (HERMETICALLY SEALED IN METAL CASES), ESTABLISHED RELIABILITY, STYLE CQR44 |
MIL-HDBK-198 Revision B:2012 | CAPACITORS, SELECTION AND USE OF |
MIL-PRF-19978-10 Revision C:2016 | CAPACITOR, FIXED, PLASTIC (OR PAPER-PLASTIC) DIELECTRIC, AXIAL-WIRE TERMINAL, TANGENTIAL RETAINER, TUBULAR (UNINSULATED) (HERMETICALLY SEALED IN METAL CASES), ESTABLISHED RELIABILITY, STYLE CQR12 |
MIL-STD-202-211 Base Document:2015 | METHOD 211, TERMINAL STRENGTH |
ISO/IEC 17025:2005 | General requirements for the competence of testing and calibration laboratories |
MIL-STD-202-302 Base Document:2015 | Method 302, Insulation Resistance |
MIL-STD-810 Revision G:2008 | ENVIRONMENTAL ENGINEERING CONSIDERATIONS AND LABORATORY TESTS |
MIL-STD-202-210 Base Document:2015 | Method 210, Resistance to Soldering Heat |
MIL-STD-1276 Revision H:2013 | Leads for Electronic Component Parts |
MIL-STD-202-305 Base Document:2015 | Method 305, Capacitance |
MIL-STD-202-209 Base Document:2015 | METHOD 209, RADIOGRAPHIC INSPECTION |
MIL-STD-202-101 Base Document:2015 | Method 101, Salt Atmosphere (Corrosion) |
MIL-STD-202-107 Base Document:2015 | Method 107, Thermal Shock |
MIL-STD-202-106 Base Document:2015 | Method 106, Moisture Resistance |
MIL-STD-202-301 Base Document:2015 | Method 301, Dielectric Withstanding Voltage |
MIL-STD-202-215 Base Document:2015 | METHOD 215, RESISTANCE TO SOLVENTS |
MIL-PRF-83421-6 Revision E:2017 | CAPACITOR, FIXED, METALLIZED PLASTIC FILM DIELECTRIC, DC AND AC, HERMETICALLY SEALED IN METAL CASES, ESTABLISHED RELIABILITY STYLES CRH31, CRH32, CRH33, CRH34, AND CRH35 |
MIL-STD-790 Revision G:2011 | ESTABLISHED RELIABILITY AND HIGH RELIABILITY QUALIFIED PRODUCTS LIST (QPL) SYSTEMS FOR ELECTRICAL, ELECTRONIC, AND FIBER OPTIC PARTS SPECIFICATIONS |
MIL-STD-202-104 Base Document:2015 | Method 104, Immersion |
ISO 10012:2003 | Measurement management systems — Requirements for measurement processes and measuring equipment |
MIL-STD-202-108 Base Document:2015 | Method 108, Life (at Elevated Ambient Temperature) |
MIL-STD-202-105 Base Document:2015 | Method 105, Barometric Pressure (Reduced) |
MIL-STD-202-208 Base Document:2015 | Method 208, Solderability |
MIL-STD-202 Revision H:2015 | ELECTRONIC AND ELECTRICAL COMPONENT PARTS |
MIL-STD-1285 Revision D:2004 | MARKING OF ELECTRICAL AND ELECTRONIC PARTS |
FED-STD-H28 Revision A:1994 | Screw-Thread Standards for Federal Services |
MIL-STD-202-201 Base Document:2015 | Method 201, Vibration |
MIL-STD-690 Revision D:2005 | Failure Rate (FR) Sampling Plans and Procedures |
MIL-STD-202-204 Base Document:2015 | Method 204, Vibration, High Frequency |
MIL-STD-202-112 Base Document:2015 | METHOD 112, SEAL |
MIL-STD-202-213 Base Document:2015 | Method 213, Shock (Specified Pulse) |
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