MIL C 55365 : C (5)
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
CAPACITOR, CHIP, FIXED, TANTALUM, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
Superseded date
07-03-1997
Superseded by
Published date
01-12-2013
Publisher
Prerequisites for fixed chip, tantalum established reliability, capacitors.
| Committee |
FSC 5910
|
| DocumentType |
Standard
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Superseded
|
| SupersededBy |
| MIL-STD-198 Revision E:1984 | CAPACITOR, SELECTION AND USE OF |
| MIL-STD-975 Revision M:1994 | NASA STANDARD (EEE) PARTS LIST |
| MIL-HDBK-11991 Base Document:1996 | DESIGN OF ELECTRICAL, ELECTRONIC, AND ELECTRO-MECHANICAL EQUIPMENT, GUIDED MISSILE AND ASSOCIATED WEAPONS SYSTEMS |
| MIL C 39003 : H | CAPACITOR, FIXED, ELECTROLYTIC (SOLID ELECTROLYTE) TANTALUM, ESTABLISHED RELIABILITY GENERAL SPECIFICATION FOR |
| MIL-E-11991 Revision E:1983 | ELECTRONIC, ELECTRICAL, AND ELECTRO-MECHANICAL EQUIPMENT, GUIDED MISSILE AND ASSOCIATED WEAPON SYSTEMS, GENERAL SPECIFICATION FOR |
| MIL-STD-1547 Revision B:1992 | ELECTRONIC PARTS, MATERIALS, AND PROCESSES FOR SPACE VEHICLES |
| MIL-P-11268 Revision L:1983 | PART, MATERIALS, AND PROCESSES USED IN ELECTRONIC EQUIPMENT |
| MIL C 39028 : C | CAPACITORS, PACKAGING OF |
| MIL C 39003 : H | CAPACITOR, FIXED, ELECTROLYTIC (SOLID ELECTROLYTE) TANTALUM, ESTABLISHED RELIABILITY GENERAL SPECIFICATION FOR |
| MIL C 55365/4 : D | CAPACITORS, CHIP, FIXED, TANTALUM, ESTABLISHED RELIABILITY, STYLES CWR06 AND CWR09 |
| EIA 554 : 1996 | METHOD SELECTION FOR ASSESSMENT OF NONCONFORMING LEVELS IN PARTS PER MILLION (PPM) |
| MIL-STD-790 Revision G:2011 | Established Reliability and High Reliability Qualified Products List (QPL) Systems for Electrical, Electronic, and Fiber Optic Parts Specifications |
| QQ-S-571 Revision F:1994 | SOLDER, ELECTRONIC (96 TO 485 DEGREES C) |
| MIL C 55365/2 : D | CAPACITOR, CHIP, FIXED, TANTALUM, ESTABLISHED RELIABILITY, STYLES CWR03 & CWR04 |
| MIL C 55365/7 : A | CAPACITORS, CHIP, FIXED, TANTALUM, ESTABLISHED RELIABILITY, STYLE CWR10 |
| MIL-STD-202 Revision H:2015 | ELECTRONIC AND ELECTRICAL COMPONENT PARTS |
| MIL-STD-1285 Revision D:2004 | MARKING OF ELECTRICAL AND ELECTRONIC PARTS |
| MIL-C-55365-9 Base Document:1990 | CAPACITORS, CHIP, FIXED, TANTALUM, ESTABLISHED RELIABILITY, STYLE CWR12 |
| EIA 557 : 2006 | STATISTICAL PROCESS CONTROL SYSTEMS |
| MIL-STD-690 Revision D:2005 | Failure Rate (FR) Sampling Plans and Procedures |
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