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MIL C 55365 : C (5)

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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CAPACITOR, CHIP, FIXED, TANTALUM, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR

Superseded date

07-03-1997

Superseded by

MIL PRF 55365 : 0012

Published date

01-12-2013

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Prerequisites for fixed chip, tantalum established reliability, capacitors.

Committee
FSC 5910
DocumentType
Standard
PublisherName
US Military Specs/Standards/Handbooks
Status
Superseded
SupersededBy

MIL-STD-198 Revision E:1984 CAPACITOR, SELECTION AND USE OF
MIL-STD-975 Revision M:1994 NASA STANDARD (EEE) PARTS LIST
MIL-HDBK-11991 Base Document:1996 DESIGN OF ELECTRICAL, ELECTRONIC, AND ELECTRO-MECHANICAL EQUIPMENT, GUIDED MISSILE AND ASSOCIATED WEAPONS SYSTEMS
MIL C 39003 : H CAPACITOR, FIXED, ELECTROLYTIC (SOLID ELECTROLYTE) TANTALUM, ESTABLISHED RELIABILITY GENERAL SPECIFICATION FOR
MIL-E-11991 Revision E:1983 ELECTRONIC, ELECTRICAL, AND ELECTRO-MECHANICAL EQUIPMENT, GUIDED MISSILE AND ASSOCIATED WEAPON SYSTEMS, GENERAL SPECIFICATION FOR
MIL-STD-1547 Revision B:1992 ELECTRONIC PARTS, MATERIALS, AND PROCESSES FOR SPACE VEHICLES
MIL-P-11268 Revision L:1983 PART, MATERIALS, AND PROCESSES USED IN ELECTRONIC EQUIPMENT

MIL C 39028 : C CAPACITORS, PACKAGING OF
MIL C 39003 : H CAPACITOR, FIXED, ELECTROLYTIC (SOLID ELECTROLYTE) TANTALUM, ESTABLISHED RELIABILITY GENERAL SPECIFICATION FOR
MIL C 55365/4 : D CAPACITORS, CHIP, FIXED, TANTALUM, ESTABLISHED RELIABILITY, STYLES CWR06 AND CWR09
EIA 554 : 1996 METHOD SELECTION FOR ASSESSMENT OF NONCONFORMING LEVELS IN PARTS PER MILLION (PPM)
MIL-STD-790 Revision G:2011 ESTABLISHED RELIABILITY AND HIGH RELIABILITY QUALIFIED PRODUCTS LIST (QPL) SYSTEMS FOR ELECTRICAL, ELECTRONIC, AND FIBER OPTIC PARTS SPECIFICATIONS
QQ-S-571 Revision F:1994 SOLDER, ELECTRONIC (96 TO 485 DEGREES C)
MIL C 55365/2 : D CAPACITOR, CHIP, FIXED, TANTALUM, ESTABLISHED RELIABILITY, STYLES CWR03 & CWR04
MIL C 55365/7 : A CAPACITORS, CHIP, FIXED, TANTALUM, ESTABLISHED RELIABILITY, STYLE CWR10
MIL-STD-202 Revision H:2015 ELECTRONIC AND ELECTRICAL COMPONENT PARTS
MIL-STD-1285 Revision D:2004 MARKING OF ELECTRICAL AND ELECTRONIC PARTS
MIL-C-55365-9 Base Document:1990 CAPACITORS, CHIP, FIXED, TANTALUM, ESTABLISHED RELIABILITY, STYLE CWR12
EIA 557 : 2006 STATISTICAL PROCESS CONTROL SYSTEMS
MIL-STD-690 Revision D:2005 Failure Rate (FR) Sampling Plans and Procedures

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