JIS C 60068-1:1993
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Environmental testing Part 1: General and guidance
Available format(s)
Hardcopy , PDF
Superseded date
12-23-2016
Superseded by
Language(s)
English, Japanese
Published date
02-15-2008
Publisher
JIS C 00 series/IEC 68 includes a series of methods of environmental test and their appropriate severities, and prescribes various atmospheric conditions for measurements and tests designed to assess the ability of specimens to perform under expected conditions of transportation, storage and all aspects of operational use. Although primarily intended for electrotechnical products this publication is not restricted to them and may be used in other fields where desired. Other methods of environmental test, specific to the individual types of specimen, may be included in the relevant specifications.
| DocumentType |
Standard
|
| Pages |
28
|
| PublisherName |
Japanese Standards Association
|
| Status |
Superseded
|
| SupersededBy |
Reaffirmed 2015
| JIS C 60068-2-20:1996 | Basic environmental testing procedures Part 2: Tests. Test T: Soldering |
| JIS C 60068-2-21:2002 | Environmental testing Part 2-21: Tests - Test U: Robustness of termination and integral mounting devices |
| JIS C 60068-2-17:2001 | Basic environmental testing procedures -- Part 2: Tests -- Test Q: Sealing Part 2: Tests - Test Q: Sealing |
| JIS C 60695-2-2:2000 | Fire hazard testing Part 2: Test methods - Section 2 - Needle-flame test |
| JIS C 0060:1993 | Fire Hazard Testing. Part 2: Test Methods, Glow-wire Test And Guidance |
| JIS C 60068-2-70:2007 | Environmental testing -- Part 2: Tests -- Test Xb: Abrasion of markings and letterings caused by rubbing of fingers and hands<br> |
| JIS C 2570:1998 | Directly heated negative temperature coefficient thermistors |
| JIS C 60068-2-65:2006 | Environmental Testing - Part 2-65: Vibration, Acoustically Induced |
| JIS C 5321:1997 | Methods of test for high frequency inductors and intermediate frequency transformers for electronic equipment |
| JIS C 5101-9:1998 | Fixed capacitors for use in electronic equipment. Part 9: Sectional specification: Fixed capacitors of ceramic dielectric, class 2 |
| JIS C 5201-4:1998 | Fixed resistors for use in electronic equipment. Part 4: Sectional specification: Fixed power resistors |
| JIS C 0664:2003 | Insulation Coordination For Low-voltage Equipment - Principles, Requirements And Tests |
| JIS C 2560-2:2006 | Cores Made Of Ferrite - Measuring Methods |
| JIS C 5101-22:2006 | Fixed Capacitors For Use In Electronic Equipment - Part 22: Sectional Specification: Fixed Surface Mount Multilayer Capacitors Of Ceramic Dielectric, Class 2 |
| JIS C 0920:2003 | Degrees of protection provided by enclosures (IP Code) |
| JIS C 60068-2-78:2004 | Environmental testing Part 2-78: Tests - Test Cab: Damp heat, steady state |
| JIS C 5504:1992 | Horn type loudspeakers |
| JIS C 5101-14:1998 | Fixed capacitors for use in electronic equipment. Part 14: Sectional specification: Fixed capacitors for electromagnetic interference suppression and connection to the supply mains |
| JIS C 6965:2007 | Mechanical Safety Of Cathode Ray Tubes |
| JIS C 6821:1999 | Test Methods For Mechanical Characteristics Of Optical Fibers |
| JIS C 5260-1:1999 | Potentiometers for use in electronic equipment Part 1: Generic specification |
| JIS C 5101-15:1998 | Fixed capacitors for use in electronic equipment. Part 15: Sectional specification: Fixed tantalum capacitors with non-solid or solid electrolyte |
| JIS C 60068-2-57:2002 | Environmental testing - Electrotechnical products - Time-history vibration test method |
| JIS X 5150:2004 | Information Technology - Generic Cabling For Customer Premises |
| JIS C 5502:1991 | Microphones |
| JIS C 60068-2-59:2001 | Environmental testing Part 2: Test methods Test Fe: Vibration - Sine-beat method |
| JIS C 6703:2002 | Generic specification of crystal filters |
| JIS C 6703:2008 | Crystal filters |
| JIS R 1651:2002 | Method For Measurement Of Pyroelectric Coefficient Of Fine Ceramics |
| JIS C 6840:2006 | Polarization Crosstalk Measurement Of Optical Fiber |
| JIS C 0704:1995 | Insulation test for control gear |
| JIS C 5101-8:1998 | Fixed capacitors for use in electronic equipment. Part 8: Sectional specification: Fixed capacitors of ceramic dielectric, class 1 |
| JIS C 5201-6:1999 | Fixed resistors for use in electronic equipment Part 6: Sectional specification: Fixed resistor networks with individually measurable resistors |
| JIS C 2811:1995 | Terminal blocks for industrial and similar use |
| JIS C 5871:1992 | Test methods of interference filter |
| JIS C 5401-4:2005 | Connectors for electronic equipment Part 4: Printed board connectors with assessed quality - Sectional specification |
| JIS C 6827:2005 | Test methods for chromatic dispersion of optical fibers |
| JIS C 60068-3-5:2006 | Environmental Testing - Part 3-5: Supporting Documentation And Guidance - Confirmation Of The Performance Of Temperature Chambers |
| JIS C 60068-2-41:1995 | Environmental testing Part 2: Tests, Test Z/BM: Combined dry heat/low air pressure tests Part 2: Tests, Test Z/BM: Combined dry heat/low air pressure tests |
| JIS C 5402:1992 | Method for test of connectors for use in electronic equipment |
| JIS C 60068-2-81:2007 | Environmental testing -- Part 2-81: Shock -- Shock response spectrum synthesis Part 2-81: Shock - Shock response spectrum synthesis |
| JIS C 6834:1999 | Plastic Cladding Multimode Optical Fibers |
| JIS C 6861:1999 | Test Methods For Mechanical Characteristics Of All Plastic Multimode Optical Fibers |
| JIS C 5963:2001 | General Rules Of Connectors With Optical Fiber Cables |
| JIS C 6871:2008 | Test Methods For Structural Parameters Of Polarization-maintaining Optical Fibers |
| JIS C 6872:2008 | Beat Length Measurement Of Polarization-maintaining Optical Fibers |
| JIS C 6863:1990 | Test methods for attenuation of all plastic multimode optical fibers |
| JIS C 61000-4-14:2004 | Electromagnetic Compatibility (emc) - Part 4-14: Testing And Measurement Techniques - Voltage Fluctuation Immunity Test |
| JIS C 5101-17:2000 | Fixed capacitors for use in electronic equipment Part 17: Sectional specification: Fixed metallized polypropylene film dielectric a.c. and pulse capacitors |
| JIS C 5402-12-6:2002 | Connectors For Electronic Equipment - Tests And Measurements - Part 12-6: Soldering Tests - Test 12f: Sealing Against Flux And Cleaning Solvents In Machine Soldering |
| JIS C 6521:1996 | Test methods of prepreg for multilayer printed wiring boards |
| JIS C 5201-8:1998 | Fixed resistors for use in electronic equipment. Part 8: Sectional specification: Fixed chip resistors |
| JIS D 1304:2004 | Electric vehicle -- Charging system -- Test method of efficiency |
| JIS C 0099:2005 | Environmental testing: Tests - Test: Test methods for solderability of surface mounting devices (SMD) by wetting balance using lead-free solder paste |
| JIS D 5301:2006 | Lead-acid starter batteries |
| JIS C 5012:1993 | Test methods for printed wiring boards |
| JIS C 5381-331:2006 | Components For Low-voltage Surge Protective Devices - Part 331: Specification For Metal Oxide Varistors (mov) |
| JIS C 60068-2-51:1997 | Basic environmental testing procedures Part 2: Tests Tests Z/BFc: Combined dry heat/vibration (sinusoidal) tests for both heat-dissipating and non-heat-dissipating specimens |
| JIS C 6462:1996 | Test methods of variable capacitors for use in electronic equipment |
| JIS C 5401-2:2005 | Connectors For Electronic Equipment - Part 2: Circular Connectors With Assessed Quality - Sectional Specification |
| JIS C 8702-1:2003 | Small-sized valve regulated lead-acid batteries Part 1: General requirements, functional characteristics - Methods of test |
| JIS C 5101-2:1998 | Fixed capacitors for use in electronic equipment. Part 2: Sectional specification: Fixed metallized polyethylene-terephthalate film dielectric d.c. capacitors |
| JIS C 6839:2001 | Optical fiber ribbon cords |
| JIS C 6435:1989 | Testing methods for low frequency transformers and inductors |
| JIS C 5101-23:2008 | Fixed Capacitors For Use In Electronic Equipment - Part 23: Sectional Specification - Fixed Surface Mount Metallized Polyethylene Naphthalate Film Dielectric Dc Capacitors |
| JIS C 6436:1995 | Power transformer for electronic equipment |
| JIS C 5201-2:1998 | Fixed resistors for use in electronic equipment. Part 2: Sectional specification: Fixed low-power non-wirewound resistors |
| JIS C 5201-5:1998 | Fixed resistors for use in electronic equipment. Part 5: Sectional specification: Fixed precision resistors |
| JIS C 60068-2-7:1993 | Basic environmental testing procedures Part 2: Tests -- Test Ga and guidance: Acceleration, steady state Part 2: Tests - Test Ga and guidance: Acceleration, steady state |
| JIS C 5873:1992 | Test methods of optical isolators for light beam transmission |
| JIS D 1303:2004 | Electric vehicles - Batteries - Test method of charging efficiency |
| JIS C 6701:2007 | Generic specification of quartz crystal units |
| JIS C 6830:1998 | Optical Fiber Cords |
| JIS C 61000-4-20:2006 | Electromagnetic Compatibility (emc) - Part 4-20: Testing And Measurement Techniques - Emission And Immunity Testing In Transverse Electromagnetic (tem) Waveguides |
| JIS C 6710:2007 | Generic specification of crystal controlled oscillators |
| JIS C 6443:1995 | Carbon potentiometers for general use |
| JIS C 5101-21:2006 | Fixed Capacitors For Use In Electronic Equipment - Part 21: Sectional Specification: Fixed Surface Mount Multilayer Capacitors Of Ceramic Dielectric, Class 1 |
| JIS C 60068-2-61:1996 | Environmental testing Part 2: Test methods Test Z/ABDM: Climatic sequence |
| JIS C 5101-20:2000 | Fixed capacitors for use in electronic equipment Part 20: Sectional specification: Fixed metallized polyphenylene sulfide film dielectric chip d.c. capacitors |
| JIS C 61000-4-17:2004 | Electromagnetic Compatibility (emc) - Part 4: Testing And Measurement Techniques - Section 17: Ripple On D.c. Input Power Port Immunity Test |
| JIS C 60068-2-75:2004 | Environmental Testing - Part 2-75: Tests - Test Eh: Hammer Test |
| JIS TS C8992-2:2006 | Photovoltaic (pv) Modules Safety Qualification - Part 2: Requirements For Testing |
| JIS C 2809:1999 | Flat, Quick-connect Terminations |
| JIS C 60068-2-21:2002 | Environmental testing Part 2-21: Tests - Test U: Robustness of termination and integral mounting devices |
| JIS C 5101-13:1999 | Fixed capacitors for use in electronic equipment Part 13: Sectional specification: Fixed polypropylene film dielectric metal foil d.c. capacitors |
| JIS C 60068-2-52:2000 | Environmental testing Part 2: Tests - Test Kb: Salt mist, cyclic (sodium, chloride solution) |
| JIS C 5441:1994 | Testing methods of switches for use in electronic equipment |
| JIS C 6838:2001 | Fiber ribbons |
| JIS C 60068-2-40:1995 | Environmental testing Part 2: Tests, Test Z/AM: Combined cold/low air pressure tests |
| JIS C 5202:1990 | Test methods of fixed resistors for electronic equipment |
| JIS C 6824:1997 | Test methods for bandwidth of multimode optical fibers |
| JIS C 5935:2005 | Measurement methods of lenses for fiber optic transmission |
| JIS C 5101-16:1999 | Fixed capacitors for use in electronic equipment Part 16: Sectional specification: Fixed metallized polypropylene film dielectric d.c. capacitors |
| JIS C 5401-1:2005 | Connectors for electronic equipment Part 1: Generic specification |
| JIS C 6825:1995 | Test methods for structural parameters of single-mode optical fibers |
| JIS C 6832:1999 | Silica Glass Multimode Optical Fibers |
| JIS C 8826:2008 | Testing methods of power conditioner for grid interconnected small polymer electrolyte fuel cell power systems |
| JIS C 60068-2-64:1997 | Environmental testing Part 2: Test methods - Test Fh: Vibration, broad-band random (digital control) and guidance |
| JIS C 5101-18:1999 | Fixed capacitors for use in electronic equipment Part 18: Sectional specification: Fixed aluminium electrolytic chip capacitors with solid (MnO2) and non-solid electrolyte |
| JIS C 5101-11:1998 | Fixed capacitors for use in electronic equipment. Part 11: Sectional specification: Fixed polyethylene-terephthalate film dielectric metal foil d.c. capacitors |
| JIS C 5260-5:2000 | Potentiometers For Use In Electronic Equipment - Part 5: Sectional Specification: Single-turn Rotary Low-power Wirewound Potentiometers |
| JIS C 5260-2:2000 | Potentiometers For Use In Electronic Equipment - Part 2 - Sectional Specification: Lead-screw Actuated And Rotary Preset Potentiometers |
| JIS C 5401-4-001:2005 | Connectors for electronic equipment -- Part 4-001: Printed Board Connectors with assessed quality -- Blank Detail Specification<br> |
| JIS C 5201-1:1998 | Fixed resistors for use in electronic equipment Part 1: Generic specification |
| JIS C 5260-4:2000 | Potentiometers For Use In Electronic Equipment - Part 4: Sectional Specification: Single-turn Rotary Power Potentiometers |
| JIS C 5311:1994 | Testing methods of power transformers for electronic equipment |
| JIS C 6445:1995 | Wirewound potentiometers |
| JIS C 5401-2-001:2005 | Connectors For Electronic Equipment - Part 2-001: Circular Connectors - Blank Detail Specification |
| JIS C 6851:2006 | Optical Fiber Cable Test Procedures |
| JIS C 60068-3-8:2006 | Environmental Testing - Part 3-8: Supporting Documentation And Guidance - Selecting Amongst Vibration Tests |
| JIS C 4402:2004 | Thyristor rectifiers for floating charge |
| JIS C 60068-2-48:2004 | Environmental Testing - Tests - Guidance On The Application Of Tests For Jis Environmental Testing Series To Simulate The Effects Of Storage |
| JIS C 60068-2-11:1989 | Basic environmental testing procedures Part 2: Tests - Test Ka: Salt mist |
| JIS C 5860:1997 | General rules of passive devices for light beam transmission |
| JIS C 5401:1991 | General rules of connectors for use in electronic equipment |
| JIS C 60068-3-7:2008 | Environmental Testing - Part 3-7: Supporting Documentation And Guidance - Measurements In Temperature Chambers For Tests A And B (with Load) |
| JIS C 6471:1995 | Test methods of copper-clad laminates for flexible printed wiring boards |
| JIS C 2570-1:2006 | Directly Heated Negative Temperature Coefficient Thermistors - Part 1: Generic Specification |
| JIS C 5381-21:2004 | Surge protective devices connected to telecommunications and signalling networks - Performance requirements and testing methods |
| JIS C 6822:1995 | Test methods for structural parameters of multimode optical fibers |
| JIS C 60068-2-50:1997 | Basic environmental testing procedures Part 2: Tests Tests Z/Afc: Combined cold/vibration (sinusoidal) tests for both heat-dissipating and non-heat-dissipating specimens |
| JIS E 4035:1995 | Railway rolling stock -- High and low temperature test methods of parts |
| JIS C 61000-4-2:1999 | Electromagnetic Compatibility (emc) - Part 4: Testing And Measurement Techniques - Section 2: Electrostatic Discharge Immunity Test |
| JIS C 5933:1993 | Test methods of optical isolators for fiber optic transmission |
| JIS C 6481:1996 | Test methods of copper-clad laminates for printed wiring boards |
| JIS C 60721-3-3:1997 | Classification of environmental conditions Part 3: Classification of groups of environmental parameters and their severities Section 3: Stationary use at weatherprotected locations Part 3: Classification of groups of environmental parameters and their severities Section 3: Stationary use at weatherprotected locations |
| JIS C 60068-2-47:2008 | Environmental testing Part 2-47: Tests - Mounting of specimens for vibration, impact and similar dynamic tests |
| JIS C 60068-2-13:1989 | This Japanese Industrial Standard specifies the low pressure tests performed at room temperature. Part 2: Tests, Test M: Low air pressure |
| JIS C 5401-3:2005 | Connectors For Electronic Equipment - Part 3: Rectangular Connectors With Assessed Quality - Sectional Specification |
| JIS C 1000-4-2:1999 | Electromagnetic Compatibility (emc) - Part 4: Testing And Measurement Techniques - Section 2: Electrostatic Discharge Immunity Test |
| JIS C 5260-3:2000 | Potentiometers For Use In Electronic Equipment - Part 3 - Sectional Specification: Rotary Precision Potentiometers |
| JIS C 5402-1:2002 | Connectors For Electronic Equipment - Tests And Measurements - Part 1: General |
| JIS F 8007:2004 | Shipbuilding - Electrical Equipments - General Requirements For Degrees Of Protection And Inspection Of Enclosures |
| JIS C 8972:1997 | Testing procedure of long discharge rate lead-acid batteries for photovoltaic systems |
| JIS C 5101-4:1998 | Fixed capacitors for use in electronic equipment. Part 4: Sectional specification: Aluminium electrolytic capacitors with solid and non-solid electrolyte |
| JIS C 60068-3-3:2000 | Environmental testing -- Part 3: Guidance Seismic test method for equipments |
| JIS C 6833:1999 | Multicomponent Glass Multimode Optical Fibers |
| JIS C 0046:1993 | Environmental testing Part 2: Test methods Test Eg: Impact, spring hammer |
| JIS C 5101-3:1998 | Fixed capacitors for use in electronic equipment. Part 3: Sectional specification: Fixed tantalum chip capacitors |
| JIS C 5101-10:1999 | Fixed capacitors for use in electronic equipment Part 10: Sectional specification: Fixed multilayer ceramic chip capacitors |
| JIS C 6831:2001 | Jacketed Optical Fibers |
| JIS C 60068-2-17:2001 | Basic environmental testing procedures -- Part 2: Tests -- Test Q: Sealing Part 2: Tests - Test Q: Sealing |
| JIS C 60068-2-58:2006 | Environmental Testing - Part 2: Tests - Test Td: Test Methods For Solderability, Resistance To Dissolution Of Metallization And To Soldering Heat Of Surface Mounting Devices (smd) |
| JIS C 0055:2000 | Environmental testing -- Part 3: Guidance Seismic test method for equipments |
| JIS C 6836:1999 | All Plastic Multimode Optical Fiber Cords |
| JIS C 60068-2-56:1996 | Environmental testing Part 2: Tests. Test Cb: Damp heat, steady state, primarily for equipment |
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