ISO 22489:2016
Current
The latest, up-to-date edition.
Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
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English
10-20-2016
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ISO 22489:2016 specifies requirements for the quantification of elements in a micrometre-sized volume of a specimen identified through analysis of the X-rays generated by an electron beam using a wavelength dispersive spectrometer (WDS) fitted either to an electron probe microanalyser or to a scanning electron microscope (SEM).
ISO 22489:2016 also describes the following:
- the principle of the quantitative analysis;
- the general coverage of this technique in terms of elements, mass fractions and reference specimens;
- the general requirements for the instrument;
- the fundamental procedures involved such as specimen preparation, selection of experimental conditions, the measurements, the analysis of these and the report.
ISO 22489:2016 is intended for the quantitative analysis of a flat and homogeneous bulk specimen using a normal incidence beam. It does not specify detailed requirements for either the instruments or the data reduction software. Operators should obtain information such as installation conditions, detailed procedures for operation and specification of the instrument from the makers of any products used.
| DevelopmentNote |
Supersedes ISO/DIS 22489. (10/2016)
|
| DocumentType |
Standard
|
| Pages |
15
|
| PublisherName |
International Organization for Standardization
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| NEN ISO 22489 : 2016 | Identical |
| BS ISO 22489:2016 | Identical |
| SAC GB/T 28634 : 2012 | Identical |
| NF ISO 22489 : 2007 | Identical |
| 16/30296413 DC : 0 | BS ISO 19463 - MICROBEAM ANALYSIS - ELECTRON PROBE MICROANALYSER (EPMA) - GUIDELINES FOR PERFORMING QUALITY ASSURANCE PROCEDURES |
| ISO/TR 10993-22:2017 | Biological evaluation of medical devices — Part 22: Guidance on nanomaterials |
| BS ISO 11938:2012 | Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy |
| 10/30185165 DC : 0 | BS ISO 11938 - MICROBEAM ANALYSIS - ELECTRON PROBE MICROANALYSIS - METHODS OF ELEMENTAL AREA ANALYSIS USING WAVELENGTH-DISPERSIVE SPECTROSCOPY |
| 04/30122733 DC : DRAFT SEP 2004 | BS ISO 22309 - MICROBEAM ANALYSIS - QUANTITATIVE ANALYSIS USING ENERGY DISPERSIVE SPECTROMETRY (EDS) |
| 17/30328207 DC : DRAFT SEP 2017 | BS ISO 20720 - MICROBEAM ANALYSIS - METHODS OF THE SPECIMEN PREPARATION FOR ANALYSIS OF GENERAL POWDERS USING WDS AND EDS |
| 04/30103951 DC : DRAFT JUN 2004 | |
| PD ISO/TR 10993-22:2017 | Biological evaluation of medical devices Guidance on nanomaterials |
| ISO 11938:2012 | Microbeam analysis — Electron probe microanalysis — Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy |
| ISO/IEC 17025:2005 | General requirements for the competence of testing and calibration laboratories |
| ISO 23833:2013 | Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary |
| ISO 14594:2014 | Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy |
| ISO 14595:2014 | Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs) |
| ISO 17470:2014 | Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry |
| ISO 22309:2011 | Microbeam analysis — Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above |
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