ISO 18115-2:2013
Withdrawn
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
View Superseded by
Surface chemical analysis Vocabulary Part 2: Terms used in scanning-probe microscopy
Available format(s)
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
Withdrawn date
12-21-2021
Superseded by
Language(s)
English
Published date
11-04-2013
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ISO 18115-2:2013 defines terms for surface chemical analysis.
| DevelopmentNote |
Together with ISO 18115-1, supersedes ISO 18115. (07/2010) Supersedes ISO/DIS 18115-2. (11/2013)
|
| DocumentType |
Standard
|
| Pages |
45
|
| PublisherName |
International Organization for Standardization
|
| Status |
Withdrawn
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| JIS K 0147-2:2017 | Identical |
| BS ISO 18115-2:2013 | Identical |
| NF ISO 18115-2 : 2010 | Identical |
| NEN ISO 18115-2 : 2010 | Identical |
| 11/30199166 DC : 0 | BS ISO 11952 - SURFACE CHEMICAL ANALYSIS - SCANNING PROBE MICROSCOPY - DETERMINATION OF GEOMETRIC QUANTITIES USING SPM - CALIBRATION OF MEASURING SYSTEMS |
| ISO 11775:2015 | Surface chemical analysis — Scanning-probe microscopy — Determination of cantilever normal spring constants |
| BS PD ISO/TS 80004-6 : 2013 | NANOTECHNOLOGIES - VOCABULARY - PART 6: NANO-OBJECT CHARACTERIZATION |
| CEN ISO/TS 80004-6:2015 | Nanotechnologies - Vocabulary - Part 6: Nano-object characterization (ISO/TS 80004-6:2013) |
| BS ISO 28600:2011 | Surface chemical analysis. Data transfer format for scanning-probe microscopy |
| ASTM E 2859 : 2011 | Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy |
| S.R. CEN ISO/TS 80004-6:2015 | NANOTECHNOLOGIES - VOCABULARY - PART 6: NANO-OBJECT CHARACTERIZATION (ISO/TS 80004-6:2013) |
| BS ISO 23833:2013 | Microbeam analysis. Electron probe microanalysis (EPMA). Vocabulary |
| ISO/TS 80004-13:2017 | Nanotechnologies — Vocabulary — Part 13: Graphene and related two-dimensional (2D) materials |
| ASTM E 2735 : 2014 : REDLINE | Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments |
| ISO 27911:2011 | Surface chemical analysis — Scanning-probe microscopy — Definition and calibration of the lateral resolution of a near-field optical microscope |
| 16/30300288 DC : 0 | BS ISO 19606 - FINE CERAMICS (ADVANCED CERAMICS, ADVANCED TECHNICAL CERAMICS) - TEST METHOD FOR SURFACE ROUGHNESS OF FINE CERAMIC FILMS BY ATOMIC FORCE MICROSCOPY |
| 13/30203230 DC : 0 | BS ISO 13095 - SURFACE CHEMICAL ANALYSIS - ATOMIC FORCE MICROSCOPY - PROCEDURE FOR IN SITU CHARACTERIZATION OF AFM PROBE SHANK PROFILE USED FOR NANOSTRUCTURE MEASUREMENT |
| BS ISO 13095:2014 | Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement |
| BS ISO 11039:2012 | Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate |
| BS ISO 20579-4:2018 | Surface chemical analysis. Guidelines to sample handling, preparation and mounting Reporting information related to the history, preparation, handling and mounting of nano-objects prior to surface analysis |
| ASTM E 2859 : 2011 : R2017 | Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy |
| ISO 20579-4:2018 | Surface chemical analysis — Guidelines to sample handling, preparation and mounting — Part 4: Reporting information related to the history, preparation, handling and mounting of nano-objects prior to surface analysis |
| ISO 11952:2014 | Surface chemical analysis Scanning-probe microscopy Determination of geometric quantities using SPM: Calibration of measuring systems |
| ISO/TR 19693:2018 | Surface chemical analysis Characterization of functional glass substrates for biosensing applications |
| PD ISO/TS 80004-13:2017 | Nanotechnologies. Vocabulary Graphene and related two-dimensional (2D) materials |
| PD CEN ISO/TS 80004-6:2015 | Nanotechnologies. Vocabulary Nano-object characterization |
| ISO 13095:2014 | Surface Chemical Analysis Atomic force microscopy Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement |
| ASTM E 1829 : 2014 : REDLINE | Standard Guide for Handling Specimens Prior to Surface Analysis |
| ISO/TR 18196:2016 | Nanotechnologies — Measurement technique matrix for the characterization of nano-objects |
| ISO/TS 80004-6:2013 | Nanotechnologies Vocabulary Part 6: Nano-object characterization |
| BS ISO 19606:2017 | Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for surface roughness of fine ceramic films by atomic force microscopy |
| BS ISO 19668:2017 | Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials |
| ISO 11039:2012 | Surface chemical analysis — Scanning-probe microscopy — Measurement of drift rate |
| ISO 19668:2017 | Surface chemical analysis — X-ray photoelectron spectroscopy — Estimating and reporting detection limits for elements in homogeneous materials |
| BS ISO 27911:2011 | Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope |
| BS ISO 11775:2015 | Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants |
| BS ISO 13083:2015 | Surface chemical analysis. Scanning probe microscopy. Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes |
| 10/30199182 DC : 0 | BS ISO 11039 - SURFACE CHEMICAL ANALYSIS - SCANNING-PROBE MICROSCOPY - MEASUREMENT OF DRIFT RATE |
| PD ISO/TR 18196:2016 | Nanotechnologies. Measurement technique matrix for the characterization of nano-objects |
| ISO 28600:2011 | Surface chemical analysis Data transfer format for scanning-probe microscopy |
| ISO 20411:2018 | Surface chemical analysis — Secondary ion mass spectrometry — Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry |
| ISO 19606:2017 | Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for surface roughness of fine ceramic films by atomic force microscopy |
| ISO 23833:2013 | Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary |
| ISO 13083:2015 | Surface chemical analysis — Scanning probe microscopy — Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes |
| ASTM E 1078 : 2014 : REDLINE | Standard Guide for Specimen Preparation and Mounting in Surface Analysis |
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