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ISO 17867:2015

Withdrawn

Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

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Particle size analysis Small-angle X-ray scattering

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Withdrawn date

10-22-2020

Superseded by

ISO 17867:2020

Language(s)

English

Published date

04-24-2015

US$81.00
Excluding Tax where applicable

Small-angle X-ray scattering (SAXS) is a well-established technique that allows structural information to be obtained about inhomogeneities in materials with a characteristic length from 1 nm to 100 nm. Under certain conditions (narrow size distributions, appropriate instrumental configuration, and idealised shape) the limit of 100 nm can be significantly extended. ISO 17687:2015 specifies a method for the application of SAXS to the estimation of mean particle sizes in dilute dispersions where the interaction between the particles is negligible. This International Standard allows two complementary data evaluation methods to be performed, model fitting and Guinier approximation. The most appropriate evaluation method shall be selected by the analyst and stated clearly in the report. SAXS is sensitive to electron density fluctuations. Therefore, particles in solution and pores in a matrix can be studied in same way.

DevelopmentNote
Supersedes ISO/DIS 17867. (04/2015)
DocumentType
Standard
Pages
23
PublisherName
International Organization for Standardization
Status
Withdrawn
SupersededBy

Standards Relationship
NEN ISO 17867 : 2015 Identical
BS ISO 17867:2015 Identical

PD ISO/TR 18196:2016 Nanotechnologies. Measurement technique matrix for the characterization of nano-objects
ISO/TR 18196:2016 Nanotechnologies — Measurement technique matrix for the characterization of nano-objects

ISO 9276-1:1998 Representation of results of particle size analysis — Part 1: Graphical representation
ISO/TS 13762:2001 Particle size analysis Small angle X-ray scattering method
ISO 26824:2013 Particle characterization of particulate systems — Vocabulary
ISO/TS 27687:2008 Nanotechnologies Terminology and definitions for nano-objects Nanoparticle, nanofibre and nanoplate
SAC GB/T 13221 : 2004 NANOMETER POWDER - DETERMINATION OF PARTICLE SIZE DISTRIBUTION - SMALL ANGLE X-RAY SCATTERING METHOD
ISO 9276-2:2014 Representation of results of particle size analysis — Part 2: Calculation of average particle sizes/diameters and moments from particle size distributions

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