ISO 16592:2012
Current
The latest, up-to-date edition.
Microbeam analysis — Electron probe microanalysis — Guidelines for determining the carbon content of steels using a calibration curve method
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English, French
07-31-2012
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ISO 16592:2012 gives guidance on a method for the determination of the carbon content in steels containing other alloying elements (less than 1 % to 2 % by mass) using the calibration curve method. It specifies the sample preparation, X-ray detection, establishment of the calibration curve and the procedure for the determination of the uncertainty of the measured carbon content. It is applicable to steels containing a mass fraction of carbon of less than 1,0 %. The method is not applicable to steels with higher carbon contents, which could significantly affect the accuracy of the analysis results.
ISO 16592 applies to analyses performed using normal beam incidence and wavelength-dispersive X-ray spectrometry; it is not designed to be used for energy-dispersive X-ray spectrometry.
| Committee |
ISO/TC 202/SC 2
|
| DevelopmentNote |
Supersedes ISO/DIS 16592. (08/2012)
|
| DocumentType |
Standard
|
| Pages |
12
|
| PublisherName |
International Organization for Standardization
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| BS ISO 16592:2012 | Identical |
| NEN ISO 16592 : 2012 | Identical |
| DIN ISO 16592:2015-12 | Identical |
| NF ISO 16592 : 2008 | Identical |
| BS ISO 11938:2012 | Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy |
| 10/30185165 DC : 0 | BS ISO 11938 - MICROBEAM ANALYSIS - ELECTRON PROBE MICROANALYSIS - METHODS OF ELEMENTAL AREA ANALYSIS USING WAVELENGTH-DISPERSIVE SPECTROSCOPY |
| ISO 11938:2012 | Microbeam analysis — Electron probe microanalysis — Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy |
| ISO/IEC 17025:2005 | General requirements for the competence of testing and calibration laboratories |
| ISO 5725-6:1994 | Accuracy (trueness and precision) of measurement methods and results — Part 6: Use in practice of accuracy values |
| ISO 23833:2013 | Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary |
| ISO 14594:2014 | Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy |
| ISO 14595:2014 | Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs) |
| ISO 17470:2014 | Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry |
| ISO 22309:2011 | Microbeam analysis — Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above |
| ISO/IEC Guide 98-3:2008 | Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995) |
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