ISO 13067:2011
Withdrawn
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
View Superseded by
Microbeam analysis Electron backscatter diffraction Measurement of average grain size
Available format(s)
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
Withdrawn date
07-17-2020
Superseded by
Language(s)
English, French
Published date
10-28-2011
Important note : All end users must be registered with an Account prior to user licenses being assigned.| DevelopmentNote |
Supersedes ISO/DIS 13067. (10/2011)
|
| DocumentType |
Standard
|
| Pages |
18
|
| PublisherName |
International Organization for Standardization
|
| Status |
Withdrawn
|
| SupersededBy |
| Standards | Relationship |
| NEN ISO 13067 : 2011 | Identical |
| NF ISO 13067 : 2012 | Identical |
| BS ISO 13067:2011 | Identical |
| DIN ISO 13067:2015-12 | Identical |
| PD ISO/TR 18196:2016 | Nanotechnologies. Measurement technique matrix for the characterization of nano-objects |
| ASTM F 3160 : 2016 | Standard Guide for Metallurgical Characterization of Absorbable Metallic Materials for Medical Implants |
| ISO/TR 18196:2016 | Nanotechnologies — Measurement technique matrix for the characterization of nano-objects |
| ISO 16700:2016 | Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification |
| ISO/IEC 17025:2005 | General requirements for the competence of testing and calibration laboratories |
| ISO 23833:2013 | Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary |
| EN 623-3:2001 | Advanced technical ceramics - Monolithic ceramics - General and textural properties - Part 3: Determination of grain size and size distribution (characterized by the Linear Intercept Method) |
| ISO 21748:2017 | Guidance for the use of repeatability, reproducibility and trueness estimates in measurement uncertainty evaluation |
| ISO 24173:2009 | Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction |
| ASTM E 1382 : 1997 | Standard Test Methods for Determining Average Grain Size Using Semiautomatic and Automatic Image Analysis |
| ASTM E 930 : 1999 | Standard Test Methods for Estimating the Largest Grain Observed in a Metallographic Section (ALA Grain Size) |
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