IEEE C62.42.0-2016
Current
The latest, up-to-date edition.
IEEE Guide for the Application of Surge-Protective Components in Surge-Protective Devices and Equipment Ports--Overview
Hardcopy , PDF
English
09-30-2017
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1. Scope
2. Definitions, acronyms, and abbreviations
3. Protection or mitigation or suppression?
4. Surge mitigation functions
5. Component technologies and characteristics
6. Examples of protective circuit configurations
Annex A (informative) - Bibliography
Annex B (informative) - Impulse (surge) generators
used to test surge-protective components (SPCs)
Annex C (informative) - Derived wave shape parameters
Annex D (informative) - Changes introduced by
IEC 61000-4-5 Edition 3 [B13]
The IEEE C62.42(TM) guide series covers surge-protective components (SPCs) used in power and telecom surge-protective devices (SPDs) and equipment ports.
| Committee |
Surge Protective Devices/Low Voltage
|
| DevelopmentNote |
Supersedes IEEE C62.42. (09/2017)
|
| DocumentType |
Standard
|
| ISBN |
978-1-5044-3685-4
|
| Pages |
66
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Current
|
| Supersedes |
| IEEE C62.42.3-2017 | IEEE Guide for the Application of Surge Protective Components in Surge Protective Devices and Equipment Ports -- Part 3: Silicon PN-Junction |
| IEC 60950-1:2005+AMD1:2009+AMD2:2013 CSV | Information technology equipment - Safety - Part 1: General requirements |
| IEEE C62.33-1982 | IEEE Standard Test Specifications for Varistor Surge-Protective Devices |
| IEC 62475:2010 | High-current test techniques - Definitions and requirements for test currents and measuring systems |
| IEEE 487-2015 | IEEE Standard for the Electrical Protection of Communications Facilities Serving Electric Supply Locations -- General Considerations |
| IEEE 487.5-2013 | IEEE Standard for the Electrical Protection of Communication Facilities Serving Electric Supply Locations Through the Use of Isolation Transformers |
| IEC 60099-4:2014 | Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems |
| IEEE C62.31-2006 | IEEE Standard Test Methods for Low-Voltage Gas-Tube Surge-Protective Device Components |
| IEC 60050-212:2010 | International Electrotechnical Vocabulary (IEV) - Part 212: Electrical insulating solids, liquids and gases |
| IEEE 487.4-2013 | IEEE Standard for the Electrical Protection of Communication Facilities Serving Electric Supply Locations Through the Use of Neutralizing Transformers |
| IEEE C62.39-2012 | IEEE Standard for Test Methods and Preferred Values for Self-Restoring Current-Limiter Components Used in Telecommunication Surge Protection |
| IEC 61643-311:2013 | Components for low-voltage surge protective devices - Part 311: Performance requirements and test circuits for gas discharge tubes (GDT) |
| IEEE C62.42.1-2016 | IEEE Guide for the Application of Surge-Protective Components in Surge Protective Devices and Equipment Ports--Part 1: Gas Discharge Tubes (GDTs) |
| IEEE 4-2013 | IEEE Standard for High-Voltage Testing Techniques |
| IEEE C62.50-2012 | IEEE Standard for Performance Criteria and Test Methods for Plug-in (Portable) Multiservice (Multiport) Surge-Protective Devices for Equipment Connected to a 120 V/240 V Single Phase Power Service and Metallic Conductive Communication Line(s) |
| IEC 61643-11:2011 | Low-voltage surge protective devices - Part 11: Surge protective devices connected to low-voltage power systems - Requirements and test methods |
| IEEE C62.37 : 1996 | TEST SPECIFICATION FOR THYRISTOR DIODE SURGE PROTECTIVE DEVICES |
| IEEE 1149.6-2003 | IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks |
| IEC TR 62066:2002 | Surge overvoltages and surge protection in low-voltage a.c. power systems - General basic information |
| IEEE C62.37.1-2012 REDLINE | IEEE Guide for the Application of Thyristor Surge Protective Device Components |
| TIA 968 : B2009 ADD 3 2016 | TELECOMMUNICATIONS TELEPHONE TERMINAL EQUIPMENT TECHNICAL REQUIREMENTS FOR CONNECTION OF TERMINAL EQUIPMENT TO THE TELEPHONE NETWORK |
| IEC 60060-1:2010 | High-voltage test techniques - Part 1: General definitions and test requirements |
| IEC 60050-521:2002 | International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits |
| IEC TR 60664-2-1:2011 | Insulation coordination for equipment within low-voltage systems - Part 2-1: Application guide - Explanation of the application of the IEC 60664 series, dimensioning examples and dielectric testing |
| IEEE C62.35-2010 | IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components |
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