IEEE 945-1984
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
IEEE Recommended Practice for Preferred Metric Units for Use in Electrical and Electronics Science and Technology
05-21-2019
English
11-30-1984
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1 Purpose
2 Space and time
3 Periodic and related phenomena
4 Mechanics
5 Heat
6 Electricity and magnetism
7 Light and related electromagnetic radiations
8 Acoustics
Index
Table
1 Multiples and submultiples of SI units
Describes the selection of metric units to promote uniformity in the use of metric units and to limit the number of different metric units which will be used in electrical and science electronics and technology.
| Committee |
Quantities, Units, and Symbols Standards Comm
|
| DocumentType |
Standard
|
| Pages |
32
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Superseded
|
| SupersededBy |
| MIL-STD-38784 Revision A:2011 | GENERAL STYLE AND FORMAT REQUIREMENTS FOR TECHNICAL MANUALS |
| IEEE 1505.1-2008 | IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505 |
| SD 10 : 20031201 | GUIDE FOR IDENTIFICATION AND DEVELOPMENT OF METRIC STANDARDS |
| BS IEC 63004:2015 | Standard for receiver fixture interface |
| MIL-DTL-24784 Revision D:2017 | MANUALS, TECHNICAL: GENERAL ACQUISITION AND DEVELOPMENT REQUIREMENTS, GENERAL SPECIFICATION FOR |
| MIL-STD-40051-2 Revision C:2015 | PREPARATION OF DIGITAL TECHNICAL INFORMATION FOR PAGE-BASED TECHNICAL MANUALS (TMS) |
| IEC 63003:2015 | Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™ |
| IEC 63004:2015 | Standard for receiver fixture interface |
| MIL-STD-40051 Revision B:2003 | PREPARATION OF DIGITAL TECHNICAL INFORMATION FOR MULTI-OUTPUT PRESENTATION OF TECHNICAL MANUALS |
| MIL-STD-40051-1 Revision C:2015 | PREPARATION OF DIGITAL TECHNICAL INFORMATION FOR INTERACTIVE ELECTRONIC TECHNICAL MANUALS (IETMS) |
| IEEE 270-2006 | IEEE Standard Definitions for Selected Quantities, Units, and Related Terms, with Special Attention to the International System of Units (SI) |
| BS IEC 63003:2015 | Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505<sup>TM</sup> |
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