IEEE 1505.1-2008
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
08-26-2019
English
08-01-2013
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1 Overview
2 Normative references
3 Definitions, acronyms, and abbreviations
4 Common test interface requirements
Annex A (normative) - Common test interface signal
definitions for pin map
Annex B (informative) - Bibliography
Annex C (informative) - IEEE List of Participants
Pertains to military and aerospace automatic test equipment (ATE) testing applications.
| Committee |
SCC20 - Test and Diagnosis for Electronic Sys
|
| DevelopmentNote |
Also numbered as IEC 63003. (12/2015)
|
| DocumentType |
Standard
|
| Pages |
170
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| DEFSTAN 66-031(PT8)/2(2016) : 2016 | REQUIREMENTS FOR ELECTRONIC AND ELECTRICAL TEST AND MEASUREMENT EQUIPMENT - PART 8: REQUIREMENTS FOR AUTOMATIC TEST SYSTEMS UTILISING AN OPEN SYSTEM ARCHITECTURE |
| IEEE 1503.3 : 2015 | THE UNIVERSAL TEST INTERFACE FRAMEWORK AND PIN CONFIGURATION FOR PORTABLE/BENCHTOP TEST REQUIREMENTS UTILIZING IEEE 1505 RECEIVER FIXTURE INTERFACE STANDARD |
| BS IEC 61671:2012 | IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML |
| IEC 61671:2012 | Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML |
| IEEE 1505.3-2015 | IEEE Standard for the Universal Test Interface Framework and Pin Configuration for Portable/Benchtop Test Requirements Utilizing IEEE 1505(TM) Receiver Fixture Interface Standard |
| IEEE 260.3-1993 | American National Standard Mathematical Signs and Symbols for Use in Physical Sciences and Technology |
| IEEE 1505-2006 | IEEE Standard for Receiver Fixture Interface |
| IEEE 260.1 : 2004 | LETTER SYMBOLS FOR UNITS OF MEASUREMENT (SI UNITS, CUSTOMARY INCH-POUND UNITS, AND CERTAIN OTHER UNITS) |
| IEEE 945-1984 | IEEE Recommended Practice for Preferred Metric Units for Use in Electrical and Electronics Science and Technology |
| IEEE/ASTM SI_10-2010 | American National Standard for Metric Practice |
| MIL-DTL-55302-180 Revision C:2008 | Connectors, Printed Circuit Subassembly and Accessories: 4 Row, Receptacle Assemblies, Right Angle, 100 through 684 Contact Positions, for Printed Wiring Boards (.100 Spacing) |
| MIL C 83733 : C | CONNECTOR, ELECTRICAL, MINIATURE, RECTANGULAR TYPE, RACK TO PANEL, ENVIRONMENT RESISTING, 200 DEGREES C TOTAL CONTINUOUS OPERATING TEMPERATURE, GENERAL SPECIFICATION FOR |
| IEEE 315 : 1975 | GRAPHIC SYMBOLS FOR ELECTRICAL AND ELECTRONICS DIAGRAMS (INCLUDING REFERENCE DESIGNATION LETTERS) |
| MIL-HDBK-217 Revision F:1991 | RELIABILITY PREDICTION OF ELECTRONIC EQUIPMENT |
| MIL-DTL-55302-179 Revision C:2007 | Connectors, Printed Circuit Subassembly and Accessories: 4 Row, Pin Assemblies, 100 through 684 Contact Positions, for Printed Wiring Boards(.100 Spacing) |
| IEEE 1149.1-2013 REDLINE | IEEE Standard for Test Access Port and Boundary-Scan Architecture |
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