IEEE 1293-1998
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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IEEE Standard Specification Format Guide and Test Procedure for Linear, Single-Axis, Non-Gyroscopic Accelerometers
03-04-2019
04-16-1999
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Part I - Specification format
1. Overview
1.1 Scope
1.2 Purpose
2. References
3. Definitions
4. Applicable documents
4.1 Specifications
4.2 Standards
4.3 Drawings
4.4 Bulletins
4.5 Other Publications
5. Requirements
5.1 Descriptions
5.2 General requirements
5.3 Performance
5.4 Mechanical requirements
5.5 Electrical and magnetic requirements
5.6 Environmental requirements
5.7 Reliability
6. Quality assurance
6.1 Classification of tests
6.2 Acceptance tests
6.3 Qualification tests
6.4 Reliability tests
6.5 Test conditions and equipment
6.6 Test methods
6.7 Data submittal
7. Preparation for delivery
8. Notes
8.1 Intended use
8.2 Ordering data
8.3 Model equation
Part II - Test procedure
9. Test procedure overview
10. Description
11. Test conditions and equipment
11.1 Standard test conditions
11.2 Test equipment
12. Test procedure
12.1 Test setup
12.2 Accelerometer nonoperating tests
12.3 Accelerometer operating tests
12.4 Electromagnetically torqued pendulous accelerometer
tests
12.5 VBA tests
12.6 Micromechanical accelerometer tests
12.7 Life tests
12.8 Reliability tests
12.9 Environmental tests
Part III - Accelerometer descriptions
Annex A (informative) Accelerometer dynamic block diagrams
A.1 Introduction
A.2 Open-loop operation
A.3 Closed-loop operation
A.4 Open-loop operation of closed-loop accelerometer
A.5 Operation with voltage-to-frequency conversion
A.6 Operation with digital capture loop
A.7 Accuracy of capture-loop readout
Annex B (informative) Digital accelerometers and comments
concerning their test methods
B.1 Introduction
B.2 Description of commonly encountered digital output
formats
B.3 Comments concerning test methods associated with
digital instruments
B.4 Annex B bibliography
Annex C (informative) Characteristics of pendulous
accelerometer
C.1 Design principles
C.2 Applications
C.3 Error sources
C.4 Tradeoffs
C.5 Environmental effects
C.6 Testing
C.7 Special requirements in the specification
C.8 Advantages and disadvantages
Annex D (informative) Overview of the characterization and
use of VBA
D.1 Introduction
D.2 Historical background
D.3 VBA: theory of operation
D.4 VBA signal processing
D.5 VBA error sources
D.6 Related developments
D.7 Annex D bibliography
Annex E (informative) VBA resonator frequency as a function
of applied acceleration
E.1 Geometry and elastic properties of vibrating beam
E.2 Square root relationship derived from energy
considerations
E.3 Direct frequency versus force relation
E.4 Frequency versus force numerical evaluation
E.5 Comparison of fit coefficients and square root
Taylor coefficients
E.6 Annex E bibliography
Annex F (informative) Micromechanical accelerometers
F.1 Micromachining
F.2 Micromachined silicon accelerometer -
flexured-mass configurations
F.3 Micromachined silicon VBAs
F.4 Annex F bibliography
Annex G (informative) Outline of error sources in
accelerometers
G.1 Introduction
G.2 Sensor characterization by mechanization
G.3 Typical sensor characterization by manufacturing
process
G.4 Error categories
G.5 Sensor physics
Part IV - Filtering, noise, and transient analyses
Annex H (informative) Digital filtering
H.1 Types of filtering and decimation
H.2 Rectangular filtering
H.3 Triangular filtering
H.4 Higher order filtering
H.4 Annex H bibliography
Annex I (informative) Noise characterization
I.1 Stochastic processes
I.2 Autocorrelation function of a stochastic process
I.3 Estimation of the autocorrelation function
I.4 Power spectral density (PSD) of a stationary
stochastic process
I.5 Estimation of the PSD
I.6 Numerical evaluation and plotting of the PSD
I.7 Characteristic PSD noise slopes
I.8 Characteristic Allan variance noise slopes
I.9 Estimation of Markov noise parameters
I.10 Annex I bibliography
Annex J (informative) Characterization of transient behavior
J.1 Types of transient behavior
J.2 Second-order ordinary differential equation
transient
J.3 Exponential, square root, and logarithmic
transients
J.4 Estimation of transient parameters
J.5 Annex J bibliography
Part V - Calibration and modeling techniques
Annex K (informative) Calibrating accelerometer model
coefficients from static multipoint
tumble data
K.1 Multipoint tumble test and analysis procedures
K.2 Model equation for multipoint tumble analysis
K.3 Multipoint tumble analysis with a single
accelerometer observable
K.4 Multipoint tumble analysis with dual orthogonal
accelerometer observables
K.5 Multipoint tumble analysis with orthogonal
accelerometer magnitude-squared-of-g observable
K.6 Least-squares maximum likelihood estimation
K.7 Annex K bibliography
Annex L (informative) Vibration test equipment, test
procedures, and analysis techniques
L.1 Test equipment and test fixtures
L.2 Test scenarios
L.3 Error sources
L.4 Test instrumentation and procedures
L.5 General comments on analysis techniques
L.6 Calibration of nonlinear coefficients from
vibration along different instrument axes
L.7 Summary
L.8 Annex L bibliography
Annex M (informative) Geophysical effects in inertial
instrument testing
M.1 Introduction
M.2 Seismic environment
M.3 Tilt and azimuth variations
M.4 Effect of lunar-solar earth tides
M.5 Effect of ocean tides
M.6 Variations in earth rotation
M.7 Annex M bibliography
Defines specification and test requirements for linear, single-axis, nongyroscopic accelerometer for use in inertial navigation, guidance, and leveling systems. Also provides a format guide and compilation of recommended test methods for such accelerometers.
| Committee |
Gyro Accelerometer Panel
|
| DevelopmentNote |
Supersedes IEEE 337 and IEEE 530. (07/2007)
|
| DocumentType |
Standard
|
| Pages |
265
|
| ProductNote |
NEW CHILD COR 1 ISS ADDED NOW
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| IEEE 2700-2014 | IEEE Standard for Sensor Performance Parameter Definitions |
| IEEE 1554-2005 | IEEE Recommended Practice for Inertial Sensor Test Equipment, Instrumentation, Data Acquisition, and Analysis |
| IEEE 836-2009 REDLINE | IEEE Recommended Practice for Precision Centrifuge Testing of Linear Accelerometers |
| IEEE/ISO/IEC 15289-2011 | ISO/IEC/IEEE Systems and software engineering -- Content of life-cycle information products (documentation) |
| IEEE 260.1 : 2004 | LETTER SYMBOLS FOR UNITS OF MEASUREMENT (SI UNITS, CUSTOMARY INCH-POUND UNITS, AND CERTAIN OTHER UNITS) |
| IEEE/ASTM SI_10-2010 | American National Standard for Metric Practice |
| IEEE SI 10-1997 | IEEE/ASTM Standard for Use of the International System of Units (SI): The Modern Metric System |
| IEEE 315 : 1975 | GRAPHIC SYMBOLS FOR ELECTRICAL AND ELECTRONICS DIAGRAMS (INCLUDING REFERENCE DESIGNATION LETTERS) |
| IEEE 836-1991 | IEEE Recommended Practice for Precision Centrifuge Testing of Linear Accelerometers |
| IEEE 260.1-1993 | American National Standard Letter Symbols for Units of Measurement (SI Units, Customary Inch-Pound Units, and Certain Other Units) |
| MIL-STD-461 Revision G:2015 | REQUIREMENTS FOR THE CONTROL OF ELECTROMAGNETIC INTERFERENCE CHARACTERISTICS OF SUBSYSTEMS AND EQUIPMENT |
| IEEE 528-2001 | IEEE Standard for Inertial Sensor Terminology |
| MIL-P-116 Revision J:1988 | PRESERVATION, METHODS OF |
| IEEE 528-1994 | IEEE Standard for Inertial Sensor Terminology |
| MIL-STD-105 Revision E:1989 | SAMPLING PROCEDURES AND TABLES FOR INSPECTION BY ATTRIBUTES |
| MIL-STD-785 Revision B:1980 | RELIABILITY PROGRAM FOR SYSTEMS AND EQUIPMENT DEVELOPMENT AND PRODUCTION |
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