IEC TS 61994-1:2007
Current
Current
The latest, up-to-date edition.
Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 1: Piezoelectric and dielectric resonators
Available format(s)
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
Language(s)
English
Published date
08-30-2007
Publisher
Important note : All end users must be registered with an Account prior to user licenses being assigned.Gives the terms and definitions for piezoelectric and dielectric resonators representing the present state-of-the-art, which are intended for use in the standards and documents of IEC TC 49. This new edition takes into account new editions of IEC TC 49 publications.
| Committee |
TC 49
|
| DevelopmentNote |
Stability Date: 2017. (09/2017)
|
| DocumentType |
Technical Specification
|
| Pages |
21
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| DD IEC/TS 61994-1:2007 | Identical |
| NEN NPR IEC/TS 61994-1 : 2007 | Identical |
| EN 62761:2014 | Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) |
| I.S. EN 62575-2:2012 | RADIO FREQUENCY (RF) BULK ACOUSTIC WAVE (BAW) FILTERS OF ASSESSED QUALITY - PART 2: GUIDELINES FOR THE USE (IEC 62575-2:2012 (EQV)) |
| BS EN 62047-7:2011 | Semiconductor devices. Micro-electromechanical devices MEMS BAW filter and duplexer for radio frequency control and selection |
| IEC 62575-2:2012 | Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use |
| 11/30254949 DC : 0 | BS EN 62761 - GUIDELINES FOR THE MEASUREMENT METHOD OF NONLINEARITY FOR SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DEVICES IN RADIO FREQUENCY (RF) |
| BS EN 62761:2014 | Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) |
| 07/30161553 DC : 0 | BS EN 60758 - SYNTHETIC QUARTZ CRYSTAL - SPECIFICATIONS AND GUIDE TO THE USE |
| I.S. EN 62047-7:2011 | SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 7: MEMS BAW FILTER AND DUPLEXER FOR RADIO FREQUENCY CONTROL AND SELECTION |
| BS EN 62575-2:2012 | Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality Guidelines for the use |
| I.S. EN 62761:2014 | GUIDELINES FOR THE MEASUREMENT METHOD OF NONLINEARITY FOR SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DEVICES IN RADIO FREQUENCY (RF) |
| IEC 62761:2014 | Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) |
| IEC 62047-7:2011 | Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection |
| 18/30366383 DC : DRAFT APR 2018 | BS EN 63155 - GUIDELINES FOR THE MEASUREMENT METHOD OF POWER DURABILITY FOR SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DEVICES IN RADIO FREQUENCY (RF) APPLICATIONS |
| 08/30172394 DC : DRAFT APR 2008 | BS EN 62047-7 - SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 7: MEMS FBAR FILTER & DUPLEXER |
| CEI EN 62575-2 : 2013 | RADIO FREQUENCY (RF) BULK ACOUSTIC WAVE (BAW) FILTERS OF ASSESSED QUALITY - PART 2: GUIDELINES FOR THE USE |
| CEI EN 62047-7 : 2012 | SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 7: MEMS BAW FILTER AND DUPLEXER FOR RADIO FREQUENCY CONTROL AND SELECTION |
| EN 62575-2:2012 | Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use |
| EN 62047-7 : 2011 | SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 7: MEMS BAW FILTER AND DUPLEXER FOR RADIO FREQUENCY CONTROL AND SELECTION |
| IEC 61019-1:2004 | Surface acoustic wave (SAW) resonators - Part 1: Generic specification |
| IEC 60050-561:2014 | International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection |
| IEC 60122-1:2002 | Quartz crystal units of assessed quality - Part 1: Generic specification |
| IEC 61338-1:2004 | Waveguide type dielectric resonators - Part 1: Generic specification |
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