IEC 63003:2015
Current
The latest, up-to-date edition.
Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English
12-14-2015
IEC 63003:2015(E) the scope is the definition of a pin map utilizing the IEEE 1505 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.
DevelopmentNote |
Also numbered as IEEE 1505.1. (12/2015)
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DocumentType |
Standard
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Pages |
162
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PublisherName |
International Electrotechnical Committee
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Status |
Current
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Standards | Relationship |
NEN IEC 63003 : 2016 | Identical |
BS IEC 63003:2015 | Identical |
MIL-DTL-55302 Revision G:2009 | CONNECTORS, PRINTED CIRCUIT SUBASSEMBLY AND ACCESSORIES |
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IEEE 260.1 : 2004 | LETTER SYMBOLS FOR UNITS OF MEASUREMENT (SI UNITS, CUSTOMARY INCH-POUND UNITS, AND CERTAIN OTHER UNITS) |
IEEE 945-1984 | IEEE Recommended Practice for Preferred Metric Units for Use in Electrical and Electronics Science and Technology |
IEEE/ASTM SI_10-2010 | American National Standard for Metric Practice |
MIL C 83733 : C | CONNECTOR, ELECTRICAL, MINIATURE, RECTANGULAR TYPE, RACK TO PANEL, ENVIRONMENT RESISTING, 200 DEGREES C TOTAL CONTINUOUS OPERATING TEMPERATURE, GENERAL SPECIFICATION FOR |
IEEE 315 : 1975 | GRAPHIC SYMBOLS FOR ELECTRICAL AND ELECTRONICS DIAGRAMS (INCLUDING REFERENCE DESIGNATION LETTERS) |
MIL-PRF-28800 Revision F:1996 | TEST EQUIPMENT FOR USE WITH ELECTRICAL AND ELECTRONIC EQUIPMENT, GENERAL SPECIFICATION FOR |
MIL-HDBK-217 Revision F:1991 | RELIABILITY PREDICTION OF ELECTRONIC EQUIPMENT |
IEEE 1149.1-2013 REDLINE | IEEE Standard for Test Access Port and Boundary-Scan Architecture |
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