IEC 62435-4:2018
Current
The latest, up-to-date edition.
Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English - French, English
06-05-2018
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Purpose of storage (facility)
5 Storage
6 Periodic check of the components
7 Removal from storage
8 Materials used in storage regimes
9 General storage environment
10 LTS methods
11 LTS double containment redundancy
Annex A (normative) - Example checklist for long-term
storage facilities
Bibliography
IEC 62435-4:2018 specifies long-term storage methods and recommended conditions for long-term storage of electronic components including logistics, controls and security related to the storage facility. Long-term storage refers to a duration that may be more than 12 months for products scheduled for long duration storage. The philosophy of such storage, good working practices and general means to facilitate the successful long-term storage of electronic components are also addressed.
Committee |
TC 47
|
DevelopmentNote |
Stability Date: 2022. (06/2018)
|
DocumentType |
Standard
|
Pages |
42
|
PublisherName |
International Electrotechnical Committee
|
Status |
Current
|
Standards | Relationship |
PN-EN IEC 62435-4:2019 | Identical |
SN EN IEC 62435-4 : 2018 | Identical |
OVE EN IEC 62435-4 : 2019 06 01 | Identical |
EN IEC 62435-4:2018 | Identical |
VDE 0884-135-4 : 2019-05 | Identical |
NF EN IEC 62435-4 : 2018 | Identical |
DIN EN IEC 62435-4 : 2019-05 | Identical |
SS-EN IEC 62435-4 : 2018 | Identical |
UNE-EN IEC 62435-4:2018 | Identical |
BS EN IEC 62435-4:2018 | Identical |
MIL-PRF-81705 Revision E:2009 | Barrier Materials, Flexible, Electrostatic Discharge Protective, Heat-Sealable |
IEC 61340-5-3:2015 | Electrostatics - Part 5-3: Protection of electronic devices from electrostatic phenomena - Properties and requirements classification for packaging intended for electrostatic discharge sensitive devices |
IEC 60749-30:2005+AMD1:2011 CSV | Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing |
IEC 61340-5-1:2016 | Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements |
IEC TS 62668-2:2016 | Process management for avionics - Counterfeit prevention - Part 2: Managing electronic components from non-franchised sources |
IEC TR 61340-5-2:2007 | Electrostatics - Part 5-2: Protection of electronic devices from electrostatic phenomena - User guide |
IEC TS 62668-1:2016 | Process management for avionics - Counterfeit prevention - Part 1: Avoiding the use of counterfeit, fraudulent and recycled electronic components |
MIL-PRF-131 Revision K:2005 | BARRIER MATERIALS, WATERVAPORPROOF, GREASEPROOF, FLEXIBLE, HEAT-SEALABLE |
IEC 60050-551:1998 | International Electrotechnical Vocabulary (IEV) - Part 551: Power electronics |
IPC J STD 033C-1:2014 | HANDLING, PACKING, SHIPPING AND USE OF MOISTURE, REFLOW, AND PROCESS SENSITIVE DEVICES |
IEC 61760-2:2007 | Surface mounting technology - Part 2: Transportation and storage conditions of surface mounting devices (SMD) - Application guide |
IEC 60068-2-17:1994 | Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing |
MIL-PRF-27401 Revision G:2013 | Propellant Pressurizing Agent, Nitrogen |
IEC TR 62258-3:2010 | Semiconductor die products - Part 3: Recommendations for good practice in handling, packing and storage |
AS/NZS IEC 62402:2020 | Obsolescence management |
IEC 62435-2:2017 | Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms |
IEC 60749-20-1:2009 | Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat |
IEC 60721-3-1:1997 | Classification of environmental conditions - Part 3 Classification of groups of environmental parameters and their severities - Section 1: Storage |
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