IEC 62396-4:2013
Current
The latest, up-to-date edition.
Process management for avionics - Atmospheric radiation effects - Part 4: Design of high voltage aircraft electronics managing potential single event effects
09-25-2013
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Potential high voltage single event effects
5 Quantifying single event burnout in avionics
for high voltage devices
6 Relevant SEB data and applying it to avionics
7 Conclusion
Bibliography
IEC 62396-4:2013(E) provides guidance on atmospheric radiation effects and their management on high voltage (nominally above 200 V) avionics electronics used in aircraft operating at altitudes up to 60 000 ft (18,3 km). This part of IEC 62396 defines the effects of that environment on high voltage electronics and provides design considerations for the accommodation of those effects within avionics systems. This part of IEC 62396 provides technical data and methodology for aerospace equipment manufacturers and designers to standardise their approach to single event effects on high voltage avionics by providing guidance, leading to a standard methodology.
This publication is to be read in conjunction with IEC 62396-1:2012.
Committee |
TC 107
|
DevelopmentNote |
Supersedes IEC TS 62396-4. To be read in conjunction with IEC 62396-1. Stability date: 2016. (09/2013)
|
DocumentType |
Standard
|
PublisherName |
International Electrotechnical Committee
|
Status |
Current
|
Supersedes |
Standards | Relationship |
BS IEC 62396-4:2013 | Identical |
IEC 62396-1:2016 | Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment |
BS IEC 62396-5:2014 | Process management for avionics. Atmospheric radiation effects Assessment of thermal neutron fluxes and single event effects in avionics systems |
IEC 62396-5:2014 | Process management for avionics - Atmospheric radiation effects - Part 5: Assessment of thermal neutron fluxes and single event effects in avionics systems |
BS IEC 62396-2:2017 | Process management for avionics. Atmospheric radiation effects Guidelines for single event effects testing for avionics systems |
BS EN 60749-44:2016 | Semiconductor devices. Mechanical and climatic test methods Neutron beam irradiated single event effect (SEE) test method for semiconductor devices |
IEC TR 62396-6:2017 | Process management for avionics - Atmospheric radiation effects - Part 6: Extreme space weather - Potential impact on the avionics environment and electronics |
BIS IS/IEC 61558-2-6 : 1ED 2016 | SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 44: NEUTRON BEAM IRRADIATED SINGLE EVENT EFFECT (SEE) TEST METHOD FOR SEMICONDUCTOR DEVICES |
17/30352610 DC : 0 | BS IEC 62396-2 ED2.0 - PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 2: GUIDELINES FOR SINGLE EVENT EFFECTS TESTING FOR AVIONICS SYSTEMS |
IEC 62396-2:2017 | Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems |
IEC TS 62239-1:2015 | Process management for avionics - Management plan - Part 1: Preparation and maintenance of an electronic components management plan |
EIA STD 4899 : 2017-05 | REQUIREMENTS FOR AN ELECTRONIC COMPONENTS MANAGEMENT PLAN |
EIA 933 : 2015 | REQUIREMENTS FOR A COTS ASSEMBLY MANAGEMENT PLAN |
IEC TR 62396-7:2017 | Process management for avionics - Atmospheric radiation effects - Part 7: Management of single event effects (SEE) analysis process in avionics design |
14/30299002 DC : 0 | BS EN 60749-44 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 44: NEUTRON BEAM IRRADIATED SINGLE EVENT EFFECT (SEE) TEST METHOD FOR SEMICONDUCTOR DEVICES |
PD IEC/TR 62396-7:2017 | Process management for avionics. Atmospheric radiation effects Management of single event effects (SEE) analysis process in avionics design |
17/30365636 DC : 0 | BS EN 62239-1 ED.1.0 - PROCESS MANAGEMENT FOR AVIONICS - MANAGEMENT PLAN - PART 1: PREPARATION AND MAINTENANCE OF AN ELECTRONIC COMPONENTS MANAGEMENT PLAN |
PD IEC/TS 62239-1:2015 | Process management for avionics. Management plan Preparation and maintenance of an electronic components management plan |
PD IEC/TR 62396-6:2017 | Process management for avionics. Atmospheric radiation effects Extreme space weather. Potential impact on the avionics environment and electronics |
EN 60749-44:2016 | Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices |
IEC 62396-1:2016 RLV | Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment |
IEC 62396-1:2016 | Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.