IEC 61169-39:2009

FOREWORD
1 Scope
2 Normative references
3 Mating interface and gauge information
  3.1 Dimensions-General connectors - Grade 2
      3.1.1 Connector with pin-centre contact
      3.1.2 Connectors with socket-centre contact
  3.2 Gauges
      3.2.1 Connectors with socket-centre contact
  3.3 Dimensions - standard test connectors - Grade 0
      3.3.1 Connector with pin-centre contact
      3.3.2 Connector with socket-centre contact
4 Quality assessment procedure
  4.1 General
  4.2 Rating and characteristics
  4.3 Test schedule and inspection requirements
      4.3.1 Acceptance tests
      4.3.2 Periodic tests
  4.4 Procedures
      4.4.1 Quality conformance inspection
      4.4.2 Qualification approval and its maintenance
5 Instructions for preparation of detail specifications
  5.1 General
  5.2 Identification of the detail specification
  5.3 Identification of the component
  5.4 Performance
  5.5 Marking, ordering information and related matters
  5.6 Selection of tests, test conditions and severities
  5.7 Blank detail specification pro-forma for type
      CQM connector
Bibliography

IEC 61169-39:2009 is a sectional specification. It provides information and rules for the preparation of detail specifications for CQM series quick lock RF connectors together with the pro forma blank detail specification (DS). It also prescribes mating interface dimensions for general purpose connectors, dimensional details of standard test connectors grade 0, gauging information and tests selected from IEC 61169-1, applicable to all detail specifications relating to CQM series connectors. This specification indicates the recommended performance characteristics to be considered when writing a detail specification and it covers test schedules and inspection requirements for assessment levels M and H. The French version of this standard has not been voted upon. This bilingual version, published in 2011-04, corresponds to the English version.