IEC 61151:1992

FOREWORD
INTRODUCTION
Clause
1 General
   1.1 Scope and object
   1.2 Normative references
   1.3 Specialized definitions
   1.4 Symbols and abbreviations
   1.5 Constants and conversion factors
2 Spectrometer
   2.1 Detectors
        2.1.1 Detector signal
        2.1.2 Rise time and fall time
   2.2 Preamplifier
   2.3 Main amplifier (shaping amplifier)
   2.4 Biased amplifier
   2.5 Multi channel analyzer
3 Test instruments
   3.1 Test set-up
        3.1.1 Test instrument accuracy
        3.1.2 Measurement accuracy
   3.2 Pulse generators
        3.2.1 Pulse generator, preamplifier tests
        3.2.2 Pulse generator, main amplifier tests
   3.3 Step attenuator
        3.3.1 Attenuator termination
   3.4 Capacitor box
   3.5 Shaping amplifier
   3.6 A.C. voltmeter
   3.7 Oscilloscope
   3.8 Non-linearity bridge
   3.9 Oscilloscope/generator calibration
4 Main amplifier measurements and specifications
   4.1 Pulse-shape parameters
        4.1.1 Front panel nomenclature, uni-polar
               shaping
        4.1.2 Front panel nomenclature, bipolar shaping
   4.2 Pulse width
   4.3 Overload recovery
        4.3.1 Overload recovery time, uni-polar
        4.3.2 Overload recovery time, bipolar
        4.3.3 Blocking (paralysis)
        4.3.4 Baseline artifacts
   4.4 Gain control calibration and main amplifier gain
        measurement
        4.4.1 Coarse gain calibration
        4.4.2 Fine gain calibration
   4.5 Noise measurement
   4.6 Noise transition gain
   4.7 Pole/zero range
   4.8 Non-linearity
   4.9 Source resistance
   4.10 Temperature sensitivity
   4.11 Supply voltage sensitivity
   4.12 Crossover walk
5 Preamplifier measurements
   5.1 Charge sensitivity
        5.1.1 Charge sensitivity versus capacitance
        5.1.2 Charge sensitivity versus capacitance,
               MCA method
        5.1.3 Charge sensitivity versus capacitance,
               bridge balance method
        5.1.4 Charge sensitivity versus capacitance
               specifications
   5.2 Size of the internal test capacitor
   5.3 Rise time versus capacitance
   5.4 Noise, preamplifiers
        5.4.1 Noise, preamplifiers for germanium
               detectors
        5.4.2 Noise, preamplifiers for silicon detectors
        5.4.3 Noise, units of equivalent r.m.s., charge
               and equivalent r.m.s. ion pairs
        5.4.4 Correction for main amplifier noise
   5.5 Preamplifier non-linearity
   5.6 Energy x count-rate product (ECRP)
        5.6.1 Determination of Cf
        5.6.2 Determination of Rf Cf
        5.6.3 Count-rate limit, d.c.-coupled preamplifier
        5.6.4 Count-rate limit, a.c.-coupled preamplifier
6 Biased amplifier measurements
   6.1 Non-linearity, biased amplifier
ANNEXES
A Spectrometer
B Test instruments
C Main amplifier measurements and specifications
D Preamplifier noise measurements
E Reference biased amplifier
F Bibliography
FIGURES

Covers test procedures for amplifier and preamplifier systems with linear pulse shaping networks for use with semiconductor, scintillation and proportional detectors in the spectrometry of ionizing radiation.