IEC 60748-2-10:1994
Current
The latest, up-to-date edition.
Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section 10: Blank detail specification for integrated circuit dynamic read/write memories
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English - French
12-21-1994
Important note : All end users must be registered with an Account prior to user licenses being assigned.
FOREWORD
INTRODUCTION
1 Marking and ordering information
2 Application related description
3 Specification of the function
4 Limiting values (absolute maximum rating system)
5 Operating conditions (within the specified operating
temperature range)
6 Electrical characteristics
7 Programming
8 Mechanical and climatic ratings, characteristics and data
9 Additional information
10 Screening
11 Quality assessment procedures
12 Structural similarity procedures
13 Test conditions and inspection requirements
14 Additional measurement method
Also bears the number QC 790107 which is the specification number in the IEC Quality Assessment System for Electronic Components (IECQ)
| DevelopmentNote |
Supersedes IEC 60186B. (07/2004) Also numbered as BS QC790107(1995) (08/2005) Stability Date: 2018. (09/2017)
|
| DocumentType |
Standard
|
| Pages |
43
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
| IEC 60747-4-2:2000 | Semiconductor devices - Discrete devices - Part 4-2: Microwave diodes and transistors - Integrated-circuit microwave amplifiers - Blank detail specification |
| IEC 61747-1:1998+AMD1:2003 CSV | Liquid crystal and solid-state display devices - Part 1: Generic specification |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.