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IEC 60747-7-5:2005

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

Semiconductor devices - Discrete devices - Part 7-5: Bipolar transistors for power switching applications

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Superseded date

12-16-2010

Superseded by

IEC 60747-7:2010

Language(s)

English

Published date

08-10-2005

US$103.00
Excluding Tax where applicable

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Letter symbols -Energies
5 Essential ratings and characteristics
  5.1 Ratings (limiting values)
  5.2 Characteristics
6 Measuring methods
  6.1 Verification of ratings (limiting values)
  6.2 Methods of measurement
7 Acceptance and reliability
  7.1 Endurance and reliability tests, and test methods
  7.2 Type tests and routine tests

This part of IEC 60747 gives requirements for bipolar switching transistors used for power switching application above 1 A. NOTE: Requirements concerning bipolar transistors in general can be found in IEC 60747-7.

DocumentType
Standard
Pages
26
PublisherName
International Electrotechnical Committee
Status
Superseded
SupersededBy

Standards Relationship
NEN IEC 60747-7-5 : 2005 Identical
BS IEC 60747-7-5:2005 Identical

IEC 60747-7:2010 Semiconductor devices - Discrete devices - Part 7: Bipolar transistors
IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General

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