I.S. EN 62341-1-1:2009
Current
The latest, up-to-date edition.
ORGANIC LIGHT EMITTING DIODE (OLED) DISPLAYS - PART 1-1: GENERIC SPECIFICATIONS
Hardcopy , PDF
English
01-01-2009
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FOREWORD
1 Scope
2 Normative references
3 Terms, definitions, units and symbols
4 Technical aspects
5 Quality assessment procedures
6 Quality approval procedure
7 Capability approval procedure
8 Test and measurement procedures
Annex A (informative) - Lot tolerance percentage
defective (LTPD) sampling plans
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
Specifies general procedures for quality assessment to be used in the IECQ-CECC system and establishes general rules for methods of electrical and optical measurements, environmental and mechanical tests and endurance tests.
| DevelopmentNote |
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
|
| DocumentType |
Standard
|
| Pages |
27
|
| PublisherName |
National Standards Authority of Ireland
|
| Status |
Current
|
| Standards | Relationship |
| EN 62341-1-1:2009 | Identical |
| IEC 62341-1-1:2009 | Identical |
| EN 62341-1-2:2009 | Organic light emitting diode displays - Part 1-2: Terminology and letter symbols |
| IEC 62341-1-2:2014 | Organic light emitting diode (OLED) displays - Part 1-2: Terminology and letter symbols |
| ISO 1101:2017 | Geometrical product specifications (GPS) — Geometrical tolerancing — Tolerances of form, orientation, location and run-out |
| IEC 62341-5:2009 | Organic light emitting diode (OLED) displays - Part 5: Environmental testing methods |
| IEC 60027-1:1992 | Letters symbols to be used in electrical technology - Part 1: General |
| EN 62341-5:2009 | Organic Light Emitting Diode (OLED) displays - Part 5: Environmental testing methods |
| IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
| ISO 8601:2004 | Data elements and interchange formats Information interchange Representation of dates and times |
| IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
| IEC 60027-4:2006 | Letter symbols to be used in electrical technology - Part 4: Rotating electric machines |
| IEC 60050-521:2002 | International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits |
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