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ENV 1292 : DRAFT 1995

Current

Current

The latest, up-to-date edition.

IDENTIFICATION CARD SYSTEMS - INTEGRATED CIRCUIT(S) CARDS AND INTERFACE DEVICES - ADDITIONAL TEST METHODS

Published date

01-12-2013

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1 Scope
2 Normative References
3 Definitions and abbreviations
3.1 definitions
3.1.1 core recommendations: The documents device under
        testing which the customer describes to the testing
        institution a precise set of tests and its suite
3.2 abbreviations
4 Test methods
4.1 ICC Electrical tests
4.1.1 I/O contact
4.1.2 Fall and rise times for I/O contact
4.1.3 VPP contact
4.1.4 CLK current
4.1.5 RST current
4.1.6 VCC current
4.2 IFD ELECTRICAL TESTS
4.2.1 Spurious voltage on outputs
4.2.2 Activation of contacts
4.2.3 VCC voltage
4.2.4 VPP contact
4.2.5 Input/Output contact
4.2.6 CLK contact
4.2.7 RST voltage
4.2.8 Card Reset
4.2.9 Deactivation of the contacts
4.2.10 Detection of card removal
4.3 ICC COMMUNICATION TESTS
4.3.1 Testing tool specifications
4.3.2 Answer to reset (ATR) timing
4.3.3 Character repetition
4.3.4 Parity error detection
4.3.5 Structure and content of ATR
4.3.6 Global characters
4.3.7 Interface characters (TAi, TBi, TCi, TDi)
4.3.9 Block Guardtime (BGT)
4.3.10 Block sequencing by the card
4.3.11 Reactions of the ICC to protocol errors
4.3.12 Recovery of a transmission error by the ICC
4.3.13 Resynchronisation
4.3.14 IFSD negotiation
4.3.15 Abortion by the IFD
4.4 IFD PHYSICAL TESTS
4.4.1 IFD location of the contacts
4.4.2 Insertion/withdrawing forces
4.4.3 Pushing force on the ICC contacts
4.4.4 Physical damage
4.4.5 Heat dissipation
4.5 IFD COMMUNICATION TESTS
4.5.1 Character repetition
4.5.2 Character frame
4.5.3 Structure of a command header for T=0 protocol
4.5.4 VPP request for T=0
4.5.5 Character Waiting Time (CWT)
4.5.6 Block Guardtime (BGT)
4.5.7 Block sequencing by the IFD
4.5.8 Reactions of the IFD to invalid PCBs
4.5.9 Recovery of a transmission error by the IFD
4.5.10 IFSC negotiation
4.5.11 Abortion by the ICC
4.5.12 Recovery of an error in a S(RESYNCH response) block

Describes test methods for Interface Devices (IFD) and IC cards (ICC) covering electrical tests for synchronous and asynchronous cards, and communication tests for asynchronous transmission for ICC, and for IFD, physical, electrical and communication tests.

DocumentType
Draft
PublisherName
Comite Europeen de Normalisation
Status
Current

Standards Relationship
I.S. ENV 1292:1995 Identical
UNI ENV 1292 : 1996 Identical
DD ENV 1292:1995 Identical
NEN NVN ENV 1292 : 1995 Identical
SNV DD ENV 1292 : 1995 Identical

TS 101 203-2 : 1.2.1 IDENTIFICATION CARD SYSTEMS; TELECOMMUNICATIONS IC CARDS AND TERMINALS; TEST METHODS AND CONFORMANCE TESTING FOR EN 726-3; PART 2: TEST SUITE STRUCTURE AND TEST PURPOSES (TSS&TP) SPECIFICATION
02/103834 DC : DRAFT JUN 2002 PREN 14475 - EXECUTION OF SPECIAL GEOTECHNICAL WORKS - REINFORCED FILL

ISO/IEC 10373:1993 Identification cards Test methods
EN 27810 : 1989 IDENTIFICATION CARDS - PHYSICAL CHARACTERISTICS
EN 27816-2 : 1989 IDENTIFICATION CARDS - INTEGRATED CIRCUIT(S) WITH CONTACTS - PART 2: DIMENSIONS AND LOCATION OF THE CONTACTS
EN 27816-3:1992/A2:1995 IDENTIFICATION CARDS - INTEGRATED CIRCUIT(S) CARDS WITH CONTACTS - PART 3: ELECTRONIC SIGNALS AND TRANSMISSION PROTOCOLS
EN 27816-1 : 1989 IDENTIFICATION CARDS - INTEGRATED CIRCUIT(S) WITH CONTACTS - PART 1: PHYSICAL CHARACTERISTICS

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