EN IEC 62884-3:2018
Current
The latest, up-to-date edition.
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators – Part 3: Frequency aging test methods
05-18-2018
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions, units and symbols
4 Frequency aging test
Annex A (normative) - Experimental verification of the
frequency aging performance
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
IEC62884-3:2018(E) describes the methods for the measurement and evaluation of frequency aging tests of piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as "Oscillator"). The purpose of those tests is to provide statistical data supporting aging predictions.This document was developed from the works related to IEC60679-1:2007 (third edition), the measurement techniques of which were restructured into different parts under a new project reference. This document describes the measurement method for frequency aging only.
| Committee |
CLC/SR 49
|
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Current
|
| Standards | Relationship |
| NEN-EN-IEC 62884-3:2018 | Identical |
| I.S. EN IEC 62884-3:2018 | Identical |
| UNE-EN IEC 62884-3:2018 | Identical |
| IEC 62884-3:2018 | Identical |
| OVE EN IEC 62884-3: 2018 | Identical |
| CEI EN IEC 62884-3 : 2018 | Identical |
| BS EN IEC 62884-3:2018 | Identical |
| IEC 62884-1:2017 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement |
| EN 60469:2013 | Transitions, pulses and related waveforms - Terms, definitions and algorithms |
| EN ISO 80000-1:2013 | Quantities and units - Part 1: General (ISO 80000-1:2009 + Cor 1:2011) |
| IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
| EN 62884-1:2017 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement |
| IEC 60679-4:1997 | Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval |
| IEC 60469:2013 | Transitions, pulses and related waveforms - Terms, definitions and algorithms |
| IEC 61760-1:2006 | Surface mounting technology - Part 1: Standard method for the specification of surface mounting components (SMDs) |
| IEC 60679-5:1998 | Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval |
| ISO 80000-1:2009 | Quantities and units — Part 1: General |
| IEC 60050-561:2014 | International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection |
| IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
| IEC 60679-1:2017 | Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification |
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