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EN 62572-3:2016

EN 62572-3:2016

Current

Current

The latest, up-to-date edition.

Fibre optic active components and devices - Reliability standards - Part 3: Laser modules used for telecommunication

Published date

06-03-2016

Publisher

European Committee for Standards - Electrical

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FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions, symbols and
  abbreviations
4 Laser reliability and quality assurance
  procedure
5 Tests
6 Activities
Annex A (informative) - Guidance on testing
        in Table 1 and Table 2
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

IEC 62572-3:2014 deals with reliability assessment of laser modules used for telecommunication.The aim of this standard is to establish a standard method of assessing the reliability of laser modules in order to minimize risks and to promote product development and reliability; to establish means by which the distribution of failures with time can be determined. This should enable the determination of equipment failure rates for specified end of life criteria. In addition, guidance is given in IEC TR 62572-2. This second edition cancels and replaces the first edition published in 2011. This second edition constitutes a technical revision in which multiple errors in references have been corrected.Keywords: reliability assessment of laser modules, telecommunication

Committee
CLC/SR 86C
DocumentType
Standard
PublisherName
European Committee for Standards - Electrical
Status
Current
Supersedes

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EN 60749-26:2014 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
IEC 60749-10:2002 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
IEC TR 62572-2:2008 Fibre optic active components and devices - Reliability standards - Part 2: Laser module degradation
EN 60749-25:2003 Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
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IEC 60749-12:2002 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
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