EN 60603-12:1998
Current
The latest, up-to-date edition.
Connectors for frequencies below 3 MHz for use with printed boards - Part 12: Detail specification for dimensions, general requirements and tests for a range of sockets designed for use with integrated circuits
02-26-1998
1 Scope
2 Normative references
3 IEC type designation
4 Common features
5 Dimensions
6 Characteristics
7 Test schedule
8 Dual-in-line sockets with solder termination for
through-board insertion (standard type)
9 Dual-in-line sockets with solderless wire wrapping
terminations for through-board insertion (standard type)
10 Dual-in-line sockets with solder terminations for
through-board insertion (low-profile type)
11 Dual-in-line sockets with solderless wire wrapping
terminations for through-board insertion (low-profile type)
12 Individual contact retention force gauge
13 Socket gauges
Annex ZA (normative) Normative references to international
publications with their corresponding European publications
Covers dimensions, general requirements and tests for a range of sockets designed for use with integrated circuits in dual-in-line format. Sockets include standard type and low-profile type.
| Committee |
CLC/SR 48B
|
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Current
|
| Standards | Relationship |
| NF EN 60603-12 : 1998 | Identical |
| IEC 60603-12:1992 | Identical |
| NBN EN 60603-12 : 1998 | Identical |
| NEN EN IEC 60603-12 : 1998 | Identical |
| PN EN 60603-12 : 2002 | Identical |
| SN EN 60603-12 : 1998 | Identical |
| UNE-EN 60603-12:1998 | Identical |
| BS EN 60603-12:1998 | Identical |
| CEI EN 60603-12 : 2001 | Identical |
| DIN EN 60603-12:1998-07 | Identical |
| PNE-EN 60603-12 | Identical |
| IEC 60512-6:1984 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods. Part 6: Climatic tests and soldering tests |
| IEC 60512-7:1993 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 7: Mechanical operating tests and sealing tests |
| IEC 60097:1991 | Grid systems for printed circuits |
| IEC 60191-2:2012 DB | Mechanical standardization of semiconductor devices - Part 2: Dimensions |
| ISO 468:1982 | Surface roughness — Parameters, their values and general rules for specifying requirements |
| IEC 60512-4:1976 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods. Part 4: Dynamic stress tests |
| IEC 60512-5:1992 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 5: Impact tests (free components), static load tests (fixed components), endurance tests and overload tests |
| IEC 60512-3:1976 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods. Part 3: Current-carrying capacity tests |
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