DSCC 99560H:2022
Current
Current
The latest, up-to-date edition.
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED DUAL NON-INVERTING MOSFET DRIVER, MONOLITHIC SILICON
Published date
12-15-2022
Publisher
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This drawing documents three product assurance class levels consisting of high reliability (device class Q), space
application (device class V) and for appropriate satellite and similar applications (device class T).
| DocumentType |
Standard
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| ProductNote |
This standard also refers to EIA/JEDEC 51-7,JEDEC PUB 95.
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| PublisherName |
Defense Supply Centre Columbus
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| Status |
Current
|
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| MIL-HDBK-103 Revision AW:2016 | LIST OF STANDARD MICROCIRCUIT DRAWINGS |
| ASTM F 1192 : 2011 | Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices |
| MIL-HDBK-780 Revision D:2004 | STANDARD MICROCIRCUIT DRAWINGS |
| MIL-PRF-38535 Revision K:2013 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
| MIL-STD-1835 Revision D:2004 | ELECTRONIC COMPONENT CASE OUTLINES |
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