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DSCC 90617E:2024

Current

Current

The latest, up-to-date edition.

MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 256K X 4 DYNAMIC RANDOM ACCESS MEMORY (DRAM), MONOLITHIC SILICON

Published date

04-04-2024

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This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V).

DocumentType
Standard
PublisherName
Defense Supply Centre Columbus
Status
Current

MIL-STD-1835 Revision D:2004 Electronic Component Case Outlines

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