DIN ISO 24173:2013-04
Current
The latest, up-to-date edition.
MICROBEAM ANALYSIS - GUIDELINES FOR ORIENTATION MEASUREMENT USING ELECTRON BACKSCATTER DIFFRACTION (ISO 24713:2009)
Hardcopy , PDF
German, English
04-01-2013
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National foreword
National Annex NA (informative) - Bibliography
Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Equipment for EBSD
5 Operating conditions
6 Calibrations required for indexing of EBSPs
7 Analytical procedure
8 Measurement uncertainty
9 Reporting the results
Annex A (informative) - Principle of EBSD
Annex B (normative) - Specimen preparation for EBSD
Annex C (informative) - Brief introduction to crystallography
and EBSP indexing, and other information useful for
EBSD
Bibliography
Provides advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD).
| Committee |
TC 202
|
| DocumentType |
Standard
|
| Pages |
48
|
| PublisherName |
German Institute for Standardisation (Deutsches Institut für Normung)
|
| Status |
Current
|
| Standards | Relationship |
| ISO 24173:2009 | Identical |
| DIN ISO 13067:2015-12 | Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2011) |
| ISO/IEC 17025:2005 | General requirements for the competence of testing and calibration laboratories |
| SAC GB/T 19501 : 2013 | MICROBEAM ANALYSIS - GENERAL GUIDE FOR ELECTRON BACKSCATTER DIFFRACTION ANALYSIS |
| ISO/IEC Guide 98-3:2008 | Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995) |
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