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DIN EN 13925-2:2003-07

Current

Current

The latest, up-to-date edition.

NON-DESTRUCTIVE TESTING - X-RAY DIFFRACTION FROM POLYCRYSTALLINE AND AMORPHOUS MATERIALS - PART 2: PROCEDURES

Available format(s)

Hardcopy , PDF

Language(s)

English, German

Published date

01-01-2003

US$110.82
Excluding Tax where applicable

Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Specimen preparation
  4.1 General preparation
  4.2 Block specimens
  4.3 Powder specimens
  4.4 Analysis of small quantities of sample
  4.5 Reactive samples and non-ambient conditions
5 Data collection
  5.1 General considerations
  5.2 Angular range and mode of data collection
  5.3 Parameters relevant to the quality of collected data
6 Data processing and analysis
  6.1 Background
  6.2 Peal searching
  6.3 Pattern decomposition into individual line profiles
      including background subtraction
  6.4 Phase identification
  6.5 Indexing
  6.6 Lattice parameter refinement
  6.7 Other types of analysis
Annex A (informative) Relationship between the XRPD standards
Annex B (informative) Example of Report Form
Annex C (informative) Scheme of a typical procedure for
        XRPD measurements
Annex D (informative) Some analytical functions used for
        profile fitting
Annex E (informative) Some methods for testing the internal
        consistency of XRPD data
E.1 General
E.2 Figures of Merit for FWHMs and intensities
E.3 Figures of Merit for line positions and lattice
    parameters
Bibliography

Describes the basic procedures applied in the X-ray Powder Diffraction (XRPD) method.

DocumentType
Standard
Pages
25
PublisherName
German Institute for Standardisation (Deutsches Institut für Normung)
Status
Current

Standards Relationship
SN EN 13925-2 : 2003 Identical
I.S. EN 13925-2:2003 Identical
BS EN 13925-2:2003 Identical
UNE-EN 13925-2:2004 Identical
NF EN 13925-2 : 2003 Identical
EN 13925-2:2003 Identical
UNI EN 13925-2 : 2006 Identical
NBN EN 13925-2 : 2003 Identical
NEN EN 13925-2 : 2003 Identical
NS EN 13925-2 : 1ED 2003 Identical

ISO 5725-1:1994 Accuracy (trueness and precision) of measurement methods and results — Part 1: General principles and definitions
EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles

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