CEI EN 62415 : 2011
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - CONSTANT CURRENT ELECTROMIGRATION TEST
Hardcopy , PDF
English
01-01-2011
Important note : All end users must be registered with an Account prior to user licenses being assigned.
FOREWORD
1 Scope
2 Symbols, terms and definitions
3 Background
4 Sample size
5 Test structures
6 Test conditions
7 Failure criteria
8 Data analysis
Bibliography
Defines a method for conventional constant current electromigration testing of metal lines, via string and contacts.
| Committee |
CT 309
|
| DevelopmentNote |
Classificazione CEI 309-27. (07/2011)
|
| DocumentType |
Standard
|
| Pages |
16
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Standards | Relationship |
| IEC 62415:2010 | Identical |
| EN 62415 : 2010 | Identical |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.