CEI EN 61643-341 : 2002
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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COMPONENTS FOR LOW-VOLTAGE SURGE PROTECTIVE DEVICES - PART 341: SPECIFICATION FOR THYRISTOR SURGE SUPPRESSOR (TSS)
Hardcopy , PDF
06-24-2021
English - Italian
01-01-2002
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1 SCOPE
2 NORMATIVE REFERENCES
3 TERMS, LETTER SYMBOLS
AND DEFINITIONS
4 BASIC FUNCTION AND
COMPONENT DESCRIPTION
5 STANDARD TEST METHODS
Annex A (normative) ABNORMAL
SERVICE CONDITIONS
Annex B (informative) - US
VERIFICATION
STANDARDS WITH
REFERENCED IMPULSE
WAVEFORMS
Annex ZA (normative) - Normative
references to international
publications with their
corresponding European
publications
Describes test specification standard for thyristor surge suppressor (TSS) components designed to limit overvoltages and divert surge currents by clipping and crowbarring actions. Such components are used in the construction of surge protective devices, particularly as they apply to telecommunications.
| Committee |
CT 37
|
| DevelopmentNote |
Classificazione CEI 37-5. (12/2002)
|
| DocumentType |
Standard
|
| Pages |
88
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| IEC 61643-341:2001 | Identical |
| EN 61643-341:2001 | Identical |
| IEC 60050-702:1992 | International Electrotechnical Vocabulary (IEV) - Part 702: Oscillations, signals and related devices |
| IEC 60721-3-9:1993 | Classification of environmental conditions - Part 3: Classification of groups of environmental parameters and their severities - Section 9: Microclimates inside products |
| IEC 60099-4:2014 | Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems |
| EN 60721-3-9:1993/A1:1995 | CLASSIFICATION OF ENVIRONMENTAL CONDITIONS - PART 3: CLASSIFICATION OF GROUPS OF ENVIRONMENTAL PARAMETERS AND THEIR SEVERITIES - SECTION 9: MICROCLIMATES INSIDE PRODUCTS |
| EN 60749 : 99 AMD 2 2001 | SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS |
| EN 60099-4:2014 | Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems |
| EN 61083-1:2001 | Instruments and software used for measurement in high-voltage impulse tests - Part 1: Requirements for instruments |
| IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
| IEC 60749:1996+AMD1:2000+AMD2:2001 CSV | Semiconductor devices - Mechanical and climatic test methods |
| IEC 60721-3-3:1994+AMD1:1995+AMD2:1996 CSV | Classification of environmental conditions - Part 3-3: Classification of groups of environmental parameters and their severities - Stationary use at weatherprotected locations |
| IEC 60747-6:2016 | Semiconductor devices - Part 6: Discrete devices - Thyristors |
| IEC 61083-1:2001 | Instruments and software used for measurement in high-voltage impulse tests - Part 1: Requirements for instruments |
| IEC 60747-2:2016 | Semiconductor devices - Part 2: Discrete devices - Rectifier diodes |
| EN 60721-3-3 : 95 AMD 2 97 | CLASSIFICATION OF ENVIRONMENTAL CONDITIONS - CLASSIFICATION OF GROUPS OF ENVIRONMENTAL PARAMETERS AND THEIR SEVERITIES - STATIONARY USE AT WEATHER-PROTECTED LOCATIONS |
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