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CEI EN 61189-5-503 : 1ED 2017

Current

Current

The latest, up-to-date edition.

TEST METHODS FOR ELECTRICAL MATERIALS, PRINTED BOARD AND OTHER INTERCONNECTION STRUCTURES AND ASSEMBLIES - PART 5-503: GENERAL TEST METHOD FOR MATERIALS AND ASSEMBLIES - CONDUCTIVE ANODIC FILAMENTS (CAF) TESTING OF CIRCUIT BOARDS

Published date

03-28-2018

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FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Testing condition
5 Specimen
6 Equipment/Apparatus or material
7 Resistance measurement method
8 Test method
9 Procedure
Annex A (informative) - Forms of electrochemical
        migration
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

Describes the conductive anodic filament (hereafter referred to as CAF) and specifies not only the steady-state temperature and humidity test, but also a temperature-humidity cyclic test and an unsaturated pressurized vapour test (HAST).

Committee
CT 309
DevelopmentNote
Classificazione CEI 91-93. (01/2018)
DocumentType
Standard
PublisherName
Comitato Elettrotecnico Italiano
Status
Current

Standards Relationship
EN 61189-5-503:2017 Identical
IEC 61189-5-503:2017 Identical

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