BS QC 760200:1992
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film integrated circuits and hybrid film integrated circuits: capability approval
Hardcopy , PDF
08-15-1997
English
08-15-1992
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Committees responsible
National foreword
Specification
1. Scope and object
1.1 Scope
1.2 Object
2. General, preferred characteristics, ratings and
severities for environmental, including mechanical
tests
2.1 Related documents
2.2 Preferred ratings and characteristics
2.3 Information to be given in a detail specification
3. Capability approval procedures
3.1 Selection of capability qualifying circuits (CQCs)
3.2 Structural similarity
3.3 Capability approval
3.4 Resubmission of rejected lots (lot-by-lot
inspection)
3.5 Manufacturing stages in a factor of an approved
manufacturer in a non-IEC member country
4. Test and measurement procedures
Appendices
A. Structural similarity rules for capability approval
B. Minimum contents of a manufacturer's capability
manual for thick film circuits
C. Minimum contents of a manufacturer's capability
manual for thin film circuits
Tables
1. Test schedule for qualification approval
2. Assessment levels and acceptance criteria for
initial capability approval
3. Assessment levels and acceptance criteria for
quality conformance inspection
4. Screening
A.1 Classification of technology, materials and
processes
A.2 Substrates
A.3 Film materials
A.4 Added non-encapsulated active chip components
A.5 Added encapsulated active components other than
chips
A.6 Added passive components
A.7 Package
A.8 Mass and dimensions of package
A.9 Limits of association in relation with mass and
dimensions
A.10 Combination criteria for environmental, including
mechanical, testing
Approval procedures to be followed for hybrids. Also lists the preferred ratings and characteristics and general performance requirements to be used in detail specifications derived from this specification, and contains the relevant similarity rules and requirements for the minimum contents of the manufacturers capability manual.
| Committee |
EPL/47
|
| DocumentType |
Standard
|
| Pages |
60
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| BS QC 760201:1997 | Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures |
| IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
| IEC 60748-21:1991 | Semiconductor devices. Integrated circuits - Part 21: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedure. |
| IEC TR 60440:1973 | Method of measurement of non-linearity in resistors |
| IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
| IEC 60063:2015 | Preferred number series for resistors and capacitors |
| IEC 60748-22-1:1997 | Semiconductor devices - Integrated circuits - Part 22-1: Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures |
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