BS ISO 22309:2011
Current
The latest, up-to-date edition.
Microbeam analysis. Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
Hardcopy , PDF
English
10-31-2011
Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Specimen preparation
5 Preliminary precautions
6 Analysis procedure
7 Data reduction
Annex A (informative) - The assignment of spectral peaks
to their elements
Annex B (informative) - Peak identity/interferences
Annex C (informative) - Factors affecting the uncertainty
of a result
Annex D (informative) - Analysis of elements with atomic
number < 11
Annex E (informative) - Example data from a reproducibility
study within a laboratory and between laboratories
Bibliography
Provides guidance on the quantitative analysis at specific points or areas of a specimen using energy-dispersive spectrometry (EDS) fitted to a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA); any expression of amount, i.e. in terms of percent (mass fraction), as large/small or major/minor amounts is deemed to be quantitative.
Committee |
CII/9
|
DevelopmentNote |
Supersedes 04/30122733 DC (05/2006) Reviewed & Confirmed by BSI, July 2017. (06/2017)
|
DocumentType |
Standard
|
Pages |
34
|
PublisherName |
British Standards Institution
|
Status |
Current
|
Supersedes |
This International Standard gives guidance on the quantitative analysis at specific points or areas of a specimen using energy-dispersive spectrometry (EDS) fitted to a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA); any expression of amount, i.e. in terms of percent (mass fraction), as large/small or major/minor amounts is deemed to be quantitative. The correct identification of all elements present in the specimen is a necessary part of quantitative analysis and is therefore considered in this International Standard. This International Standard provides guidance on the various approaches and is applicable to routine quantitative analysis of mass fractions down to 1%, utilizing either reference materials or “standardless” procedures. It can be used with confidence for elements with atomic number Z
Standards | Relationship |
ISO 22309:2011 | Identical |
ISO 16700:2016 | Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification |
ISO/IEC 17025:2005 | General requirements for the competence of testing and calibration laboratories |
ISO Guide 33:2015 | Reference materials — Good practice in using reference materials |
EN 1071-4:2006 | Advanced technical ceramics - Methods of test for ceramic coatings - Part 4: Determination of chemical composition by electron probe microanalysis (EPMA) |
ISO 14594:2014 | Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy |
ISO 14595:2014 | Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs) |
ISO 15632:2012 | Microbeam analysis Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis |
ISO/IEC Guide 98-3:2008 | Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995) |
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