BS ISO 18257:2016
Current
The latest, up-to-date edition.
Space systems. Semiconductor integrated circuits for space applications. Design requirements
Hardcopy , PDF
English
11-30-2016
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Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Abbreviated terms
5 General requirements
6 Design process
7 Detailed requirements
Annex A (normative) - Datasheet
Annex B (informative) - Guidance
Bibliography
Defines the basic design requirements for semiconductor ICs for space applications, including its design process, as well as required tasks and requirements of each stage.
| Committee |
ACE/68
|
| DevelopmentNote |
Supersedes 15/30303546 DC. (11/2016)
|
| DocumentType |
Standard
|
| Pages |
36
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| ISO 18257:2016 | Identical |
| IEC 61967-2:2005 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method |
| IEC 62215-3:2013 | Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method |
| ISO 10795:2011 | Space systems Programme management and quality Vocabulary |
| IEEE 1149.1-2013 REDLINE | IEEE Standard for Test Access Port and Boundary-Scan Architecture |
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