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BS ISO 13067:2011

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size

Available format(s)

Hardcopy , PDF

Superseded date

07-17-2020

Superseded by

BS ISO 13067:2020

Language(s)

English

Published date

11-30-2011

US$257.86
Excluding Tax where applicable

Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Acquiring a map by EBSD for grain size measurement
5 Acquiring the map for grain sizing by EBSD
6 Analytical procedure
7 Measurement uncertainty
8 Reporting of analysis results
Annex A (informative) - Grain size measurement
Bibliography

Specifies procedures for measuring average grain size derived from a two-dimensional polished cross-section using electron backscatter diffraction (EBSD).

Committee
CII/9
DocumentType
Standard
Pages
32
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

Standards Relationship
ISO 13067:2011 Identical

ISO 16700:2016 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
ISO/IEC 17025:2005 General requirements for the competence of testing and calibration laboratories
ISO 23833:2013 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
EN 623-3:2001 Advanced technical ceramics - Monolithic ceramics - General and textural properties - Part 3: Determination of grain size and size distribution (characterized by the Linear Intercept Method)
ISO 21748:2017 Guidance for the use of repeatability, reproducibility and trueness estimates in measurement uncertainty evaluation
ISO 24173:2009 Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
ASTM E 1382 : 1997 Standard Test Methods for Determining Average Grain Size Using Semiautomatic and Automatic Image Analysis
ASTM E 930 : 1999 Standard Test Methods for Estimating the Largest Grain Observed in a Metallographic Section (ALA Grain Size)

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