BS IEC 62396-2:2017
Current
The latest, up-to-date edition.
Process management for avionics. Atmospheric radiation effects Guidelines for single event effects testing for avionics systems
Hardcopy , PDF
English
01-11-2018
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FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Abbreviated terms
5 Obtaining SEE data
6 Availability of existing SEE data for avionics applications
7 Considerations for SEE testing
8 Converting test results to avionics SEE rates
Annex A (informative) - Sources of SEE data published before
the year 2000
Bibliography
Pertains to provide guidance related to the testing of electronic components for purposes of measuring their susceptibility to single event effects (SEE) induced by neutrons generated by cosmic ray interactions in the Earths atmosphere (atmospheric neutrons).
| Committee |
GEL/107
|
| DevelopmentNote |
Supersedes DD IEC/TS 62396-2 & 11/30256756 DC. (08/2014)
|
| DocumentType |
Standard
|
| Pages |
46
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
This part of IEC 62396 aims to provide guidance related to the testing of electronic components for purposes of measuring their susceptibility to single event effects (SEE) induced by neutrons generated by cosmic ray interactions in the Earth’s atmosphere (atmospheric neutrons). Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of electronic components and boards due to atmospheric neutrons at aircraft altitudes.
Although developed for the avionics industry, this process can be applied by other industrial sectors.
| Standards | Relationship |
| IEC 62396-2:2017 | Identical |
| IEC 60749-38:2008 | Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory |
| BIS IS/IEC 61558-2-6 : 1ED 2016 | SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 44: NEUTRON BEAM IRRADIATED SINGLE EVENT EFFECT (SEE) TEST METHOD FOR SEMICONDUCTOR DEVICES |
| IEC 62396-4:2013 | Process management for avionics - Atmospheric radiation effects - Part 4: Design of high voltage aircraft electronics managing potential single event effects |
| IEC 62396-5:2014 | Process management for avionics - Atmospheric radiation effects - Part 5: Assessment of thermal neutron fluxes and single event effects in avionics systems |
| IEC 62396-3:2013 | Process management for avionics - Atmospheric radiation effects - Part 3: System design optimization to accommodate the single event effects (SEE) of atmospheric radiation |
| IEC 62396-1:2016 | Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment |
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