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BS IEC 62396-1 : 2016

Current

Current

The latest, up-to-date edition.

PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 1: ACCOMMODATION OF ATMOSPHERIC RADIATION EFFECTS VIA SINGLE EVENT EFFECTS WITHIN AVIONICS ELECTRONIC EQUIPMENT

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2016

US$388.09
Excluding Tax where applicable

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Abbreviations and acronyms
5 Radiation environment of the atmosphere
6 Effects of atmospheric radiation on avionics
7 Guidance for system designs
8 Determination of avionics single event effects rates
9 Considerations for SEE compliance
Annex A (informative) - Thermal neutron assessment
Annex B (informative) - Methods for calculating SEE
        rates in avionics electronics
Annex C (informative) - Review of test facility availability
Annex D (informative) - Tabular description of variation
        of atmospheric neutron flux with altitude and latitude
Annex E (informative) - Consideration of effects at higher
        altitudes
Annex F (informative) - Prediction of SEE rates for ions
Annex G (informative) - Late news as of 2014 on SEE
        cross-sections applicable to the atmospheric neutron
        environment
Annex H (informative) - Calculating SEE rates from
        non-white (non-atmospheric like) neutron
        cross-sections for small geometry electronic
        components
Bibliography

Pertains to provide guidance on atmospheric radiation effects on avionics electronics used in aircraft operating at altitudes up to 60000 ft (18,3 km).

Committee
GEL/107
DevelopmentNote
Supersedes DD IEC TS 62396-1 & 11/30246255 DC. (05/2015) Supersedes 15/30324422 DC. (02/2016)
DocumentType
Standard
Pages
108
PublisherName
British Standards Institution
Status
Current
Supersedes

Standards Relationship
IEC 62396-1:2016 Identical

MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
SAE ARP 4754 : 2010 GUIDELINES FOR DEVELOPMENT OF CIVIL AIRCRAFT AND SYSTEMS
MIL-PRF-19500 Revision P:2010 SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
IEC TS 62396-3:2008 Process management for avionics - Atmospheric radiation effects - Part 3: Optimising system design to accommodate the single event effects (SEE) of atmospheric radiation
IEC TS 62239-1:2015 Process management for avionics - Management plan - Part 1: Preparation and maintenance of an electronic components management plan
SAE ARP 4761 : 1996 GUIDELINES AND METHODS FOR CONDUCTION THE SAFETY ASSESSMENT PROCESS ON CIVIL AIRBORNE SYSTEMS AND EQUIPMENT
FAA AC 23.1309-1 : 2011 SYSTEM SAFETY ANALYSIS AND ASSESSMENT FOR PART 23 AIRPLANES
IEC TS 62396-2:2008 Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems
IEC TS 62396-4:2008 Process management for avionics - Atmospheric radiation effects - Part 4: Guidelines for designing with high voltage aircraft electronics and potential single event effects
FAA AC 25.1309-1 : 0 SYSTEM DESIGN AND ANALYSIS
MIL-PRF-38535 Revision K:2013 Integrated Circuits (Microcircuits) Manufacturing, General Specification for
AIAA R 100 : A 2001 RECOMMENDED PRACTICE FOR PARTS MANAGEMENT
IEC TS 62396-5:2008 Process management for avionics - Atmospheric radiation effects - Part 5: Guidelines for assessing thermal neutron fluxes and effects in avionics systems
EIA 4899 : 2001 STANDARD FOR PREPARING AN ELECTRONIC COMPONENTS MANAGEMENT PLAN

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