BS EN ISO 17526:2003
Current
The latest, up-to-date edition.
Optics and optical instruments. Lasers and laser-related equipment. Lifetime of lasers
Hardcopy , PDF
English
08-20-2003
Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
3.1 Modes of operation
3.2 Operating conditions
3.3 Lifetime related terms
3.4 Types and classification
3.5 Others
4 Symbols and abbreviated terms
4.1 Symbols
4.2 Abbreviated terms
5 Test methods
5.1 General
5.2 Selection of lasers for lifetime testing
5.3 Lifetime test in APPC- and ACC-mode
5.4 Lifetime test at APC-mode
5.5 Lifetime tests at limited aperture
6 Evaluation and extrapolation
7 Test report
Bibliography
Specifies terms and definitions as well as test methods and evaluation procedures to characterize, estimate and predict the longterm behaviour of various types of lasers. Also defines terms for the lifetime of lasers and specifies test procedures and fundamental aspects for the determination of lifetime. It applies for all types of lasers for which lifetime is a critical issue, including diode lasers except those used in telecommunications.
Committee |
CPW/172
|
DevelopmentNote |
Supersedes 02/700060 DC. (07/2003)
|
DocumentType |
Standard
|
Pages |
24
|
PublisherName |
British Standards Institution
|
Status |
Current
|
Supersedes |
This International Standard covers terms and definitions as well as test methods and evaluation procedures to characterize, estimate and predict the longterm behaviour of various types of lasers.
This International Standard defines terms for the lifetime of lasers and specifies test procedures and fundamental aspects for the determination of lifetime. It applies for all types of lasers for which lifetime is a critical issue, including diode lasers except those used in telecommunications.
Standards | Relationship |
EN ISO 17526:2003 | Identical |
ISO 17526:2003 | Identical |
I.S. EN ISO 17526:2003 | Identical |
UNI EN ISO 17526 : 2003 | Identical |
NEN EN ISO 17526 : 2003 | Identical |
DIN EN ISO 17526:2003-10 | Identical |
NBN EN ISO 17526 : 2003 | Identical |
UNE-EN ISO 17526:2004 | Identical |
NS EN ISO 17526 : 1ED 2003 | Identical |
SN EN ISO 17526 : 2003 | Identical |
NF EN ISO 17526 : 2003 | Identical |
ISO 11554:2017 | Optics and photonics — Lasers and laser-related equipment — Test methods for laser beam power, energy and temporal characteristics |
ISO 11252:2013 | Lasers and laser-related equipment — Laser device — Minimum requirements for documentation |
IEC 60319:1999 | Presentation and specification of reliability data for electronic components |
ISO 16269-7:2001 | Statistical interpretation of data — Part 7: Median — Estimation and confidence intervals |
ISO 2859:1974 | Sampling procedures and tables for inspection by attributes |
EN ISO 11554:2017 | Optics and photonics - Lasers and laser-related equipment - Test methods for laser beam power, energy and temporal characteristics (ISO 11554:2017) |
IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
IEC 61703:2016 | Mathematical expressions for reliability, availability, maintainability and maintenance support terms |
EN ISO 11145:2016 | Optics and photonics - Lasers and laser-related equipment - Vocabulary and symbols (ISO 11145:2016) |
ISO 11145:2016 | Optics and photonics Lasers and laser-related equipment Vocabulary and symbols |
IEC 61751:1998 | Laser modules used for telecommunication - Reliability assessment |
IEC 61040:1990 | Power and energy measuring detectors, instruments and equipment for laser radiation |
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