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BS EN 62506:2013

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

Methods for product accelerated testing

Available format(s)

Hardcopy , PDF

Superseded date

01-12-2024

Superseded by

BS EN IEC 62506:2023

Language(s)

English

Published date

09-30-2013

US$364.65
Excluding Tax where applicable

Committee
DS/1
DevelopmentNote
Supersedes 10/30238858 DC.
DocumentType
Standard
Pages
92
PublisherName
British Standards Institution
Status
Superseded
SupersededBy
Supersedes

IEC 62506:2013 provides guidance on the application of various accelerated test techniques for measurement or improvement of product reliability. Identification of potential failure modes that could be experienced in the use of a product/item and their mitigation is instrumental to ensure dependability of an item. The object of the methods is to either identify potential design weakness or provide information on item dependability, or to achieve necessary reliability/availability improvement, all within a compressed or accelerated period of time. This standard addresses accelerated testing of non-repairable and repairable systems. It can be used for probability ratio sequential tests, fixed duration tests and reliability improvement/growth tests, where the measure of reliability may differ from the standard probability of failure occurrence. This standard also extends to present accelerated testing or production screening methods that would identify weakness introduced into the product by manufacturing error, which could compromise product dependability. Keywords: test techniques for measurement or improvement of product reliability

Standards Relationship
IEC 62506:2013 Identical
EN 62506 : 2013 Identical

IEC 61125:1992 Unused hydrocarbon based insulating liquids - Test methods for evaluating the oxidation stability
IEC 60812:2006 Analysis techniques for system reliability - Procedure for failure mode and effects analysis (FMEA)
IEC 61649:2008 Weibull analysis
IEC 61014:2003 Programmes for reliability growth
IEC 62429:2007 Reliability growth - Stress testing for early failures in unique complex systems
IEC 62303:2008 Radiation protection instrumentation - Equipment for monitoring airborne tritium
EN 60300-3-1:2004 Dependability management - Part 3-1: Application guide - Analysis techniques for dependability - Guide on methodology
EN 61649:2008 Weibull analysis
IEC TR 62380:2004 Reliability data handbook - Universal model for reliability prediction of electronics components, PCBs and equipment
IEC 61163-2:1998 Reliability stress screening - Part 2: Electronic components
EN 61710:2013 Power law model - Goodness-of-fit tests and estimation methods
IEC 61124:2012 Reliability testing - Compliance tests for constant failure rate and constant failure intensity
EN 62429:2008 Reliability growth - Stress testing for early failures in unique complex systems
IEC 60300-3-1:2003 Dependability management - Part 3-1: Application guide - Analysis techniques for dependability - Guide on methodology
IEC 61164:2004 Reliability growth - Statistical test and estimation methods
IEC 61703:2016 Mathematical expressions for reliability, availability, maintainability and maintenance support terms
IEC 61709:2017 Electric components - Reliability - Reference conditions for failure rates and stress models for conversion
IEC 60605-2:1994 Equipment reliability testing - Part 2: Design of test cycles
EN 61014:2003 Programmes for reliability growth
EN 61709:2017 Electric components - Reliability - Reference conditions for failure rates and stress models for conversion
EN 61164:2004 Reliability growth - Statistical test and estimation methods
MIL-HDBK-189 Revision C:2011 RELIABILITY GROWTH MANAGEMENT
EN 61124:2012 RELIABILITY TESTING - COMPLIANCE TESTS FOR CONSTANT FAILURE RATE AND CONSTANT FAILURE INTENSITY (IEC 61124:2012)
IEC 61710:2013 Power law model - Goodness-of-fit tests and estimation methods
IEC 60300-3-5:2001 Dependability management - Part 3-5: Application guide - Reliability test conditions and statistical test principles

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