BS EN 623-4:2004
Current
The latest, up-to-date edition.
Advanced technical ceramics. Monolithic ceramics. General and textural properties Determination of surface roughness
Hardcopy , PDF
English
10-15-2004
Foreword
1 Scope
2 Normative references
3 Terms and definitions
4 Principles of conventional surface texture measurement
5 Factors affecting the determination of surface texture
of ceramics
6 Test procedure
7 Test report
Annex A (informative) - Interlaboratory evaluation of ceramic
surface texture test procedures
Bibliography
Describes the use of conventional stylus type instruments for the measurement of surface texture of advanced monolithic technical ceramics, sets the test machine measuring parameters and recommends the adoption of certain precautions and conditions of measurement.
Committee |
RPI/13
|
DevelopmentNote |
Supersedes DD ENV 623-4. (10/2004) Reviewed and confirmed by BSI, September 2009. (08/2009)
|
DocumentType |
Standard
|
Pages |
16
|
PublisherName |
British Standards Institution
|
Status |
Current
|
Supersedes |
Standards | Relationship |
I.S. EN 623-4:2004 | Identical |
SN EN 623-4 : 2005 | Identical |
NEN EN 623-4 : 2004 | Identical |
DIN EN 623-4:2005-01 | Identical |
NBN EN 623-4 : 2004 | Identical |
NF EN 623-4 : 2005 | Identical |
NEN NVN ENV 623-4 : 1994 | Identical |
NS EN 623-4 : 1ED 2004 | Identical |
EN 623-4:2004 | Identical |
UNI EN 623-4 : 2005 | Identical |
ISO/IEC 17025:2005 | General requirements for the competence of testing and calibration laboratories |
ISO 12179:2000 | Geometrical Product Specifications (GPS) Surface texture: Profile method Calibration of contact (stylus) instruments |
EN ISO 13565-3:2000 | Geometrical Product Specifications (GPS) - Surface texture: Profile method; surfaces having stratified functional properties - Part 3: Height characterization using the material probability curve (ISO 13565-3:1998) |
ISO 4287:1997 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters |
ISO 13565-3:1998 | Geometrical Product Specifications (GPS) Surface texture: Profile method; Surfaces having stratified functional properties Part 3: Height characterization using the material probability curve |
EN ISO 4288:1997 | Geometrical product specifications (GPS) - Surface texture: Profile method - Rules and procedures for the assessment of surface texture (ISO 4288:1996) |
ENV 1006 : DRAFT 2003 | ADVANCED TECHNICAL CERAMICS - MONOLITHIC CERAMICS - GUIDANCE ON THE SELECTION OF TEST PIECES FOR THE EVALUATION OF PROPERTIES |
EN 623-1:2006 | Advanced technical ceramics - Monolithic ceramics - General and textural properties - Part 1: Determination of the presence of defects by dye penetration |
EN ISO 13565-2:1997 | Geometrical product specifications (GPS) - Surface texture: Profile method; surfaces having stratified functional properties - Part 2: Height characterization using the linear material ratio curve (ISO 13565-2:1996) |
ISO 5436-2:2012 | Geometrical product specifications (GPS) — Surface texture: Profile method; Measurement standards — Part 2: Software measurement standards |
EN ISO 5436-2:2012 | Geometrical product specifications (GPS) - Surface texture: Profile method; Measurement standards - Part 2: Software measurement standards (ISO 5436-2:2012) |
ISO 3274:1996 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal characteristics of contact (stylus) instruments |
ISO 5436-1:2000 | Geometrical Product Specifications (GPS) — Surface texture: Profile method; Measurement standards — Part 1: Material measures |
EN ISO 13565-1:1997 | Geometrical product specifications (GPS) - Surface texture: Profile method; surfaces having stratified functional properties - Part 1: Filtering and general measurement conditions (ISO 13565-1:1996) |
EN ISO 3274:1997 | Geometrical product specifications (GPS) - Surface texture: Profile method - Nominal characteristics of contact (stylus) instruments (ISO 3274:1996) |
EN ISO 5436-1:2000 | Geometrical Product Specifications (GPS) - Surface texture: Profile method; Measurement standards - Part 1: Material measures (ISO 5436-1:2000) |
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