BS EN 62276:2016
Current
The latest, up-to-date edition.
Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
Hardcopy , PDF
English
12-31-2016
Important note : All end users must be registered with an Account prior to user licenses being assigned.| Committee |
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| DevelopmentNote |
Supersedes BS PD IEC/PAS 62276. (02/2006) Supersedes 03/108069 DC. (03/2006) Supersedes 09/30207175 DC. (02/2013) Supersedes 15/30318551 DC. (12/2016)
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| DocumentType |
Standard
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| Pages |
46
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| PublisherName |
British Standards Institution
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| Status |
Current
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| Supersedes |
IEC 62276:2016 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators. This edition includes the following significant technical changes with respect to the previous edition:
- Corrections of Euler angle indications in Table 1 and axis directions in Figure 3.
- Definition of \'twin\' is not explained clearly enough in 3.3.3. Therefore it is revised by a more detailed definition.
- Etch channels maximum number at quartz wafer of seed which do not pass through from surface to back surface are classified for three grades in 4.2.13 a). Users use seed portions of quartz wafers for devices. They request quartz wafers with less etch channels in seeds to reduce defects of devices. The classification of etch channels in seed may prompt a rise in quartz wafer quality.
| Standards | Relationship |
| SN EN 62276 : 2016 | Identical |
| IEC 62276:2016 | Identical |
| NBN EN 62276 : 2013 | Identical |
| I.S. EN 62276:2016 | Identical |
| DIN EN 62276:2015-04 (Draft) | Identical |
| EN 62276:2016 | Identical |
| NF EN 62276 : 2013 | Identical |
| EN 60335-2-3:2002/A11:2010 | Identical |
| ISO 4287:1997 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters |
| EN 61019-1:2005 | Surface acoustic wave (SAW) resonators - Part 1: Generic specification |
| IEC 61019-1:2004 | Surface acoustic wave (SAW) resonators - Part 1: Generic specification |
| EN 61019-2:2005 | Surface acoustic wave (SAW) resonators - Part 2: Guide to the use |
| IEC 60862-1:2015 | Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification |
| IEC 60758:2016 | Synthetic quartz crystal - Specifications and guidelines for use |
| IEC 61019-2:2005 | Surface acoustic wave (SAW) resonators - Part 2: Guide to the use |
| IEC 60862-2:2012 | Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use |
| IEC 60862-3:2003 | Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines |
| EN 60758:2016 | Synthetic quartz crystal - Specifications and guidelines for use |
| IEC 61019-3:1991 | Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections |
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