BS EN 61837-2 : 2011
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES
Hardcopy , PDF
08-08-2018
English
01-01-2014
Important note : All end users must be registered with an Account prior to user licenses being assigned.
1 Scope
2 Normative references
3 Configuration of enclosures
4 Designation of types
5 Ceramic enclosure dimensions
6 Lead connections
7 Designation of ceramic enclosures
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
Specifies the outlines and terminal lead connections as they apply to surface-mounted devices (SMD) for frequency control and selection in ceramic enclosures, and is based on IEC 61240.
| Committee |
EPL/48
|
| DevelopmentNote |
To be read in conjunction with BS EN 61240. Supersedes 97/230674 DC. (10/2005) Supersedes 09/30200395 DC. (08/2011) 2011 Edition Re-Issued in August 2014 & incorporates AMD 1 2014. Supersedes 13/30278803 DC. (08/2014)
|
| DocumentType |
Standard
|
| Pages |
92
|
| PublisherName |
British Standards Institution
|
| Status |
Withdrawn
|
| Supersedes |
| Standards | Relationship |
| NBN EN 61837-2 : 2011 AMD 1 2014 | Identical |
| I.S. EN 61837-2:2011 | Identical |
| EN 61837-2:2011/A1:2014 | Identical |
| NF EN 61837-2 : 2012 AMD 1 2014 | Identical |
| DIN EN 61837-2:2014-10 | Identical |
| IEC 61837-2:2011+AMD1:2014 CSV | Identical |
| EN 60862-1:2015 | Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification |
| IEC 60191-6:2009 | Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages |
| EN 61019-1:2005 | Surface acoustic wave (SAW) resonators - Part 1: Generic specification |
| EN 60368-2-2:1999 | Piezoelectric filters - Part 2: Guide to the use of piezoelectric filters - Section 2: Piezoelectric ceramic filters |
| EN ISO 1101:2017 | Geometrical product specifications (GPS) - Geometrical tolerancing - Tolerances of form, orientation, location and run-out (ISO 1101:2017) |
| IEC 60122-3:2010 | Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections |
| EN 61240:2017 | Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules |
| ISO 1101:2017 | Geometrical product specifications (GPS) — Geometrical tolerancing — Tolerances of form, orientation, location and run-out |
| IEC 61019-1:2004 | Surface acoustic wave (SAW) resonators - Part 1: Generic specification |
| IEC 60368-1:2000+AMD1:2004 CSV | Piezoelectric filters of assessed quality - Part 1: Genericspecification |
| EN 60368-3:2010 | Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections |
| IEC 60862-1:2015 | Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification |
| IEC 60368-3:2010 | Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections |
| IEC 61240:2016 | Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules |
| IEC 61019-2:2005 | Surface acoustic wave (SAW) resonators - Part 2: Guide to the use |
| IEC 60122-2:1983 | Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection |
| IEC 60862-2:2012 | Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use |
| IEC 60862-3:2003 | Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines |
| EN 60679-3:2013 | Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections |
| IEC 60368-2-2:1996 | Piezoelectric filters - Part 2: Guide to the use of piezoelectricfilters - Section 2: Piezoelectric ceramic filters |
| EN 60862-3:2003 | Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines |
| EN 60862-2:2012 | Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use |
| IEC 60679-3:2012 | Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections |
| IEC 60679-2:1981 | Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators |
| EN 60191-6:2009 | Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages |
| IEC 60368-2-1:1988 | Piezoelectric filters - Part 2-1: Guide to the use of piezoelectric filters - Quartz crystal filters |
| EN 60368-1:2000/A1:2004 | PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| IEC 60679-1:2017 | Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification |
| EN 60122-3:2010 | Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.